Martin Grabmann

• Institut für Mikroelektronik- und Mechatronik-Systeme

We present a CMOS image sensor (CIS) based time-resolved fluorescence (TRF) measurement system for filter-less, highly sensitive readout of lateral-flow assay (LFA) test strips. The CIS contains a 256 × 128 lock-in pixel (LIP) sensor array. Each pixel has a size of $10 \ {\mu }\mathrm{m}$ × $10 \ {\mu }\mathrm{m}$ and includes a photodiode acti...

Designing PCBs requires experience and knowledge about bad designs, e.g. sensitive signals being influenced by aggressively switching ones in close proximity. Those interactions can hardly be detected by formal checks and are usually treated in review processes or by lengthy design iterations. An automated way for identifying potentially harmful re...

Behavior models of Analog/Mixed-Signal (AMS) components are used in today’s System-on-Chip (SoC) verification mainly for improving simulation speed. In addition, they can be used to enable verification scenarios including back-box intellectual properties (IP). Writing and maintaining such models is still time consuming and prevents widespread use....

Analog/Mixed-Signal (AMS) design and verification strongly relies on more or less abstract models to make extensive simulations feasible. Maintaining consistent behavior between system model and implementation is crucial for a correct verification. Besides the functionality, this also involves the operating conditions: A faulty model might introduc...

Motivated by the need to tolerate faults, this paper presents a complete fault management solution that includes fault detection and categorization, maintaining a map of faults, and modified scheduling and application algorithms for using healthy resources only. As the system maintains fairly sophisticated models of itself regarding faulty and heal...