
Martin Grabmann- Institut für Mikroelektronik- und Mechatronik-Systeme
Martin Grabmann
- Institut für Mikroelektronik- und Mechatronik-Systeme
About
16
Publications
651
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48
Citations
Current institution
Education
February 2016 - June 2016
May 2015 - April 2017
October 2011 - May 2015
Publications
Publications (16)
We present a CMOS image sensor (CIS) based time-resolved fluorescence (TRF) measurement system for filter-less, highly sensitive readout of lateral-flow assay (LFA) test strips. The CIS contains a 256 × 128 lock-in pixel (LIP) sensor array. Each pixel has a size of
$10 \ {\mu }\mathrm{m}$
×
$10 \ {\mu }\mathrm{m}$
and includes a photodiode acti...
Designing PCBs requires experience and knowledge about bad designs, e.g. sensitive signals being influenced by aggressively switching ones in close proximity. Those interactions can hardly be detected by formal checks and are usually treated in review processes or by lengthy design iterations. An automated way for identifying potentially harmful re...
Behavior models of Analog/Mixed-Signal (AMS) components are used in today’s System-on-Chip (SoC) verification mainly for improving simulation speed. In addition, they can be used to enable verification scenarios including back-box intellectual properties (IP). Writing and maintaining such models is still time consuming and prevents widespread use....
Analog/Mixed-Signal (AMS) design and verification strongly relies on more or less abstract models to make extensive simulations feasible. Maintaining consistent behavior between system model and implementation is crucial for a correct verification. Besides the functionality, this also involves the operating conditions: A faulty model might introduc...
Motivated by the need to tolerate faults, this paper presents a complete fault management solution that includes fault detection and categorization, maintaining a map of faults, and modified scheduling and application algorithms for using healthy resources only. As the system maintains fairly sophisticated models of itself regarding faulty and heal...