Licai Jiang

Licai Jiang
Rigaku Innovative Technologies · R&D

About

21
Publications
637
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65
Citations

Publications

Publications (21)
Conference Paper
Practically, all modern x-ray diffractometers, SAXS, TXRF systems and many other laboratory X-ray instruments are equipped with multilayer X-ray optics. It is due to a much higher flux these instruments have comparing with those having no optics or having a grazing incidence optics without multilayer coatings. There are variety of the multilayer op...
Patent
Full-text available
A system for analyzing a sample is provided. The system includes an optical system capable of providing a one-dimensional beam and a two-dimensional beam. The system may include a beam selection device to select between providing a one-dimensional x-ray beam to the sample in a one-dimensional operation mode and a two-dimensional x-ray beam to the s...
Patent
Full-text available
A system for analyzing a sample is provided. The system includes a beam selection device for selecting between a one-dimensional operation mode for providing a one-dimensional x-ray beam to the sample and a two-dimensional operation mode for providing a two-dimensional x-ray beam to the sample.
Article
Full-text available
SUNBIM (Supramolecular & SUbmolecular Nano & Bio Materials X-ray IMaging Project) is a suite of integrated programs developed, in collaboration with Rigaku Innovative Technologies, to treat Small and Wide Angle X-ray Scattering data, collected either in transmission geometry (SAXS/WAXS) or in reflection geometry (GISAXS/GIWAXS). In addition, a spec...
Patent
Full-text available
A X-ray scattering measurement device and measurement method can measure, with high resolution, the intensity of X-rays which have undergone small-angle scattering and diffraction with reflection geometry and can easily and accurately measure a microstructure on the surface of a sample. The X-ray scattering measurement device is suitable for micros...
Conference Paper
Laser-produced plasma (LPP) sources for extreme ultraviolet lithography (EUVL) systems utilize CO2 lasers operating with wavelength 10.6μm. Since multilayer-coated optics have high reflectivity for this infrared radiation (IR), a significant and detrimental amount of IR is passed through the EUVL system. One method to remove the IR from the system...
Article
Johansson crystals have been known for many decades as x-ray optical elements with a high resolving power and small foci. However, in the past their use in applications requiring a small focus and a narrow band pass were limited by imperfections caused by the technologies applied to their manufacture. While high performance Johansson crystals might...
Article
X-ray diffraction systems based on a microfocusing X-ray source and multilayer side-by-side optics are suitable for X-ray diffraction studies in a variety of fields, such as protein crystallography, due to their compactness and low cost in maintenance. However, new problems can occur, such as intensity instability induced by source position driftin...
Article
Two-dimensional multilayer optics have been widely used for enhancing and monochromatizing x-ray beams for various diffraction applications. However, when they are applied to Mo Kalpha radiation, the performance suffers from the fact that multilayer optics can use only a very small portion of the source. This is because the rocking curve of a multi...
Article
Multilayer optics is one of the widely applied optics for conditioning an X-ray beam in the region of X-ray diffraction. Multilayer optics offers a well-balanced performance. The beam conditioned by a multilayer optic is characterized by low divergence, good spectrum purity, and high intensity. This article will start with a short historical note o...
Article
Graphite monochromator and total reflection mirror (TR) systems have been widely used as x-ray beam conditioning optics for diffractometers and many other kinds of instruments. These optics serve as collimating tools, intensity enhancement tools, and band pass filters. A graphite monochromator is a Bragg reflector and delivers monochromatic beam. B...
Article
In this paper, a new coordinate condition in general relativity is proposed. This coordinate condition is just Euler's equations of the harmonic map theory. It is shown that in case of rectangular coordinates our coordinate condition reduces to Fock's harmonic coordinate condition. Using this new coordinate condition the different spherical symmetr...

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