Kaushal Arun PareekTechnische Universität Chemnitz · Chair of Materials and Reliability of Microsystems
Kaushal Arun Pareek
Master of Science
PhD student. Working on the development of Non-Destructive Evaluation Techniques using Infrared Thermography and DL.
About
11
Publications
854
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Introduction
Hello,
I'm a PhD student at the Technical University of Chemnitz. My research interests are non-destructive evaluation techniques using infrared thermography, image enhancement algorithms, deep learning for defect detection, thermal management for microelectronics, structure function calculation algorithm and linear algebra.
Education
September 2016 - September 2019
June 2010 - June 2014
Publications
Publications (11)
The vision of a deep learning-empowered non-destructive evaluation technique aligns perfectly with the goal of zero-defect manufacturing, enabling manufacturers to detect and repair defects actively. However, the dearth of data in manufacturing is one of the biggest obstacles to realizing an intelligent defect detection system. This work presents a...
Graphical abstract to our paper titled "Synthetic data generation using finite element method to pre-train an image segmentation model for defect detection using infrared thermography".
For more details, read the article (open access), the doi: https://doi.org/10.1007/s10845-024-02326-1
In this work, a Thermal Test Vehicle (TTV) is developed to demonstrate the thermal characterization utilities for large die area packages. The TTV consists of a silicon Thermal Test Chip (TTC) on organic interposer assembled with lid and thermally conductive adhesive as thermal interface material. The setup mimics the system-level application and t...
Electronic components of which reliability cannot be quantified are unacceptable and potentially hazardous, especially in safety-relevant areas such as driver assistance systems and medical technology where the zero-error principle applies. Reliability as a quality criterion has its origin in production, i.e. process variations have a negative infl...