Joshua Taillon

Joshua Taillon
National Institute of Standards and Technology | NIST · Office of Data and Informatics

PhD Materials Science and Engineering

About

27
Publications
4,522
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229
Citations
Additional affiliations
July 2011 - July 2016
University of Maryland, College Park
Position
  • PhD Student

Publications

Publications (27)
Article
This work introduces NexusLIMS, an electron microscopy laboratory information management system designed and implemented by the Office of Data and Informatics and the Materials Science and Engineering Division at NIST for a multi-user electron microscopy co-op facility. NexusLIMS comprises network infrastructure, shared information technology resou...
Article
NexusLIMS: Leveraging Shared Microscopy Resources for Data Analysis with a Configurable Laboratory Information Management System - Joshua Taillon, Raymond Plante, Marcus Newrock, June Lau, Gretchen Greene
Article
Full-text available
Zinc (carboxylate) soaps, formed by reactions between zinc oxide (ZnO) and fatty acids in a drying oil, are known to cause deterioration in the paint layers of modern and contemporary oil paintings. This study investigates zinc carboxylates that developed in an oil painting test panel designed to mimic the aging and degradation encountered in actua...
Article
Harvesting Microscopy Experimental Context with a Configurable Laboratory Information Management System - Volume 25 Supplement - Joshua A. Taillon, Rachel F. Devers, Raymond L. Plante, Marcus W. Newrock, June W. Lau, Gretchen Greene
Article
We report a transmission electron microscopy (TEM) study of the impacts of phosphorus and boron passivation processes at 4H-SiC/SiO2 interfaces. The chemical and electronic structures at these interfaces have been analyzed using high-resolution TEM and spatially resolved electron energy-loss spectroscopy (EELS), uncovering a range of phenomena caus...
Article
An Open Evaluation of Hyperspectral Unmixing Strategies for EDS Analysis - Volume 24 Supplement - Joshua A. Taillon
Article
Compressive Sensing Reconstruction for EDS Analysis - Volume 24 Supplement - Joshua A. Taillon
Presentation
Full-text available
Equipment evaluation method based on quantifiable testing and comparative evaluation of complex, multi-functional dual-beam Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrumentation. Multiple Original Equipment Manufacturers (OEMs) are offering various FIB and FIB/SEM tools for use in sample preparation, patterning, lithography,...
Article
FIB/SEM nanotomography (FIB-nt) is a powerful technique for the determination and quantification of the three-dimensional microstructure in subsurface features. Often times, the microstructure of a sample is the ultimate determiner of the overall performance of a system, and a detailed understanding of its properties is crucial in advancing the mat...
Article
Full-text available
Electron Microscopy (Big and Small) Data Analysis With the Open Source Software Package HyperSpy - Volume 23 Issue S1 - Francisco de la Pena, Tomas Ostasevicius, Vidar Tonaas Fauske, Pierre Burdet, Petras Jokubauskas, Magnus Nord, Mike Sarahan, Eric Prestat, Duncan N. Johnstone, Joshua Taillon, Jan Caron, Tom Furnival, Katherine E. MacArthur, Alber...
Article
Full-text available
This letter describes an innovative spin-coating system, built from off-the-shelf components, that can easily and inexpensively be integrated into any laboratory environment. Combined with a liquid suspension of conductive polymer, such a “rotary coater” enables simple coating of planar samples to create a physical protective barrier on the sample...
Presentation
Full-text available
Various FIB tools are available from multiple Original Equipment Manufacturers (OEMs) to use in sample preparation, patterning, lithography, 3D imaging, and other analytical and prototyping applications of FIB/SEM instruments. Multitude of equipment choices presents end-users with necessity of evaluating different tools for suitability to the varie...
Article
The near-field optical response of metal alloyed nanostructures obtained via a physical deposition method is presented. Dewetting of metallic thin films is implemented to produce fully alloyed AgxAu1−x nanoparticles and show how the chemical composition affects their optical response. These results demonstrate the potential for realizing alloyed na...
Article
M. S. Leite and co-workers demonstrate the fabrication of fully alloyed metallic nanostructures with engineered optical properties for applications ranging from nanophotonics to hydrogen sensing, in article number 1600568. Near-field microscopy measurements and simulations show that unique values of localized surface plasmon resonance (LSPR) are ob...
Article
Few-walled carbon nanotubes offer a unique marriage of graphitic quality and robustness to ink-processing; however, doping procedures that may alter the band structure of these few-walled nanotubes are still lacking. This report introduces a novel solution-injected chemical vapor deposition growth process to fabricate the first boron-doped few-wall...
Article
Full-text available
The impact of sintering temperature on Cr-poisoning of solid oxide fuel cell (SOFC) cathodes was systematically studied. La0.6Sr0.4Fe0.8Co0.2O3-δ-Ce0.9Gd0.1O2-δ symmetric cells were aged at 750°C in synthetic air with the presence of Crofer 22 APU, a common high temperature interconnect, over 200 hours and electrochemical impedance spectroscopy (EI...
Thesis
The atomic-level structure and chemistry of materials ultimately dictate their observed macroscopic properties and behavior. As such, an intimate understanding of these characteristics allows for better materials engineering and improvements in the resulting devices. In our work, two material systems were investigated using advanced electron and io...
Article
Full-text available
div class="title">Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using FIB/SEM and TEM - Volume 21 Issue S3 - Joshua Taillon, Christopher Pellegrinelli, Yilin Huang, Eric Wachsman, Lourdes Salamanca-Riba
Article
Full-text available
div class="title">Characterization of the Oxide-Semiconductor Interface in 4H-SiC/SiO2 Structures using TEM and XPS - Volume 21 Issue S3 - Joshua Taillon, Karen Gaskell, Gang Liu, Leonard Feldman, Sarit Dahr, Tsvetanka Zheleva, Aivars Lelis, Lourdes Salamanca-Riba
Article
Polarization losses associated with the cathode oxygen reduction reaction and degradation of cathode materials remain as hurdles for widespread implementation of solid oxide fuel cells (SOFC). Rates of degradation depend significantly on the operating temperature and gas conditions, such as the presence of unwanted oxygen-containing compounds, name...
Conference Paper
Introduction Solid state batteries offer increased safety, high voltage stability, and simpler electrolyte chemistry than organic electrolytes. Their inherent protection from dendrite growth gives the capability to use metallic lithium anodes. Recent advances have improved conductivity to within an order of magnitude of organic electrolytes at roo...
Conference Paper
An understanding of the degradation mechanisms of SOFC cathodes under operating conditions is essential for the development of commercial, low temperature (<700°C) SOFCs with high performance. Literature shows that the presence of H2O in the cathode impacts the performance of SOFCs. In this study, we attempt to determine the degradation mechanisms...
Conference Paper
While impressive solid oxide fuel cell (SOFC) performance has been achieved, durability under “real world” conditions is still an issue for commercial deployment. In particular cathode exposure to H2O and CO2 results in long-term performance degradation issues. Therefore, we have embarked on a multi-faceted fundamental investigation of the effect o...
Conference Paper
Composite cathodes in solid oxide fuel cells (SOFCs) improve performance by increasing the triple phase boundary length and providing a more continuous pathway through the electrolyte for oxygen ion transport. These cathodes however, are susceptible to performance degradation from exposure to contaminants such as H2O and CO2 vapor. The microstructu...
Article
The 4H-SiC/SiO2 interface in MOSFET devices contains a high density of electrically active traps. Recent work has revealed an inverse relationship between the SiC-SiO2 transition layer width and FET channel mobility. Interfacial N and P, introduced by nitric oxide (NO) anneals, nitrogen plasma (N2P), or phosphosilicate glass (PSG) passivations impr...
Article
We present a systematic characterization of the transition layer at the 4H-SiC/SiO2 interface as a function of nitric oxide (NO) post-annealing time, using high-resolution transmission electron microscopy for structural characterization and spatially resolved electron energy-loss spectroscopy for chemical analysis. We propose a systematic method fo...
Article
Full-text available
Group I/II materials exhibit unexpected structural phase transitions at high pressures, providing potential insight into the origins of elemental superconductivity. We present here a computational study of elemental barium and binary sodium-calcium alloys to identify both known and unknown phases of barium under pressure, as well as stable high-pre...

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