Jean-Louis Scotto di QuaqueroYncrea Toulon · Smart Objects
Jean-Louis Scotto di Quaquero
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This paper presents a way to implement a test structure able to measure accurately a large number of threshold voltage values for Metal Oxide Semiconductor Field Effect Transistors (MOSFETs) matching characterization. A multiplexed system able to select a single transistor among others in a small array is used. This architecture guarantees a simila...