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Jean-Louis Scotto di Quaquero

Jean-Louis Scotto di Quaquero
Yncrea Toulon · Smart Objects

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Article
This paper presents a way to implement a test structure able to measure accurately a large number of threshold voltage values for Metal Oxide Semiconductor Field Effect Transistors (MOSFETs) matching characterization. A multiplexed system able to select a single transistor among others in a small array is used. This architecture guarantees a simila...