Ina Holfelder

Ina Holfelder
Physikalisch-Technische Bundesanstalt | PTB · Scientific Instrumentation

Doctor of Engineering

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12
Publications
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137
Citations

Publications

Publications (12)
Article
A novel double full-cylinder crystal x-ray spectrometer for x-ray emission spectroscopy (XES) has been realized based on a modified von Hamos geometry. The spectrometer is characterized by its compact dimensions, its versatility with respect to the number of crystals used in series in the detection path, and the option to perform calibrated XES mea...
Preprint
Full-text available
In this work the complete L-emission spectrum of gadolinium with respect to line energies, natural line widths, and relative transition probabilities was investigated using monochromatized synchrotron radiation. The measurements were realized in the PTB laboratory at BESSY II by means of an in-house built von Hamos spectrometer based on up to two f...
Article
We present valence‐to‐core X‐ray emission spectroscopy of Ti, TiO, and TiO2 by means of a double crystal von Hamos spectrometer based on full‐cylinder highly annealed pyrolytic graphite mosaic crystals. We demonstrate that, using a double crystal configuration, an energy resolution of E/ΔE ≈ 2,700 can be achieved in a compact setup using cylindrica...
Article
The redefinition of the kilogram will be based on Planck's constant, which can be calculated from Avogadro's constant, and hence by 'counting' the silicon atoms in a monocrystalline 28Si sphere weighing one kilogram. To reduce the influence of the surface layers on the determined value requires, amongst other issues, an accurate quantification of t...
Conference Paper
A novel type of ultra-high vacuum instrument for X-ray reflectometry and spectrometry-related techniques for nanoanalytics by means of synchrotron radiation (SR) has been constructed and commissioned at BESSY II. This versatile instrument was developed by the PTB, Germany’s national metrology institute, and includes a 9-axis manipulator that allows...
Conference Paper
For the quantitative surface characterization of a monocrystalline silicon sphere PTB has constructed and taken into operation an analytical instrumentation, which combines X-ray fluorescence and X-ray photoelectron spectroscopy techniques. The main objective of this novel instrumentation is the characterization of the oxide layer and unintentional...
Article
Full-text available
Highly annealed pyrolytic graphite (HAPG) is an advanced type of pyrolytic graphite that, as a mosaic crystal, combines high integral reflectivity with a very low mosaicity of typically less than 0.1°. When used as dispersive X-ray optics, a high resolving power has been observed, rendering HAPG very suitable for applications in high-resolution X-r...
Article
Full-text available
Die röntgenspektrometrische Methodik, welche u. a. durch radiometrisch kalibrierte Instrumentierung die physikalische Rückführbarkeit der Quantifizierung auf SI-Einheiten gewährleistet, stellt derzeit ein Alleinstellungsmerkmal der PTB dar. Für die Röntgenspektrometrie stehen verschiedene Strahlrohre im PTB-Laboratorium bei BESSY II in den Spektral...
Article
Full-text available
X-ray spectrometry based on radiometrically calibrated instruments, which ensures the physical traceability of quantification to the SI units, is a unique feature of PTB. For X-ray spectrometry, various beamlines are available at PTB’s laboratory at BESSY II in the spectral ranges of soft and hard X-rays (78 eV to 10.5 keV), as well as the “BAMline...
Article
A novel ultra-high vacuum instrument for X-ray reflectometry and spectrometry-related techniques for nanoanalytics by means of synchrotron radiation has been constructed and commissioned. This versatile instrument was developed by the Physikalisch-Technische Bundesanstalt, Germany's national metrology institute, and includes a 9-axis manipulator th...
Article
Full-text available
The scaling down of critical dimensions for the manufacturing of nanoelectronics requires the continuous introduction of new materials. The results of the analysis of thin high-k films made from Al2O3 as reference samples were used at multiple laboratories to show the power and strength of complementary metrology, e.g. using various techniques, suc...

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Projects (2)