Federico Izzia

Federico Izzia
Protochips · Marketing

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10
Publications
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Publications

Publications (10)
Patent
Full-text available
The present application is directed to a novel spectrometer configured with a built-in attenuated total reflectance (ATR) and accessory compartment. In particular, an arranged sample analysis compartment provided by the spectrometer performs attenuated total reflectance analysis of a sample and includes a crystal, a tip configured to press the samp...
Patent
Full-text available
A method and corresponding apparatus provide correction of chemical images collected with a germanium hemisphere ATR microscope. A model is developed for rays passing through a simulated germanium (Ge) hemisphere attenuated total reflection (ATR) microscope. The model determines a data set for rays reaching the detector plane. Movement of the hemis...
Article
Many analytical challenges to modern laboratories involve mixtures, whether formulated or contaminated. The infrared spectra of mixtures exhibit peaks from each component, making separation of peaks due to specific components an essential part of the analysis. This can be accomplished in two ways - spatial separation of components through microscop...
Article
Full-text available
With new image analysis software for infrared spectroscopy, semi-quantitative studies can be performed without the use of standards providing rapid measurements of component concentrations when an approximate value is suitable or when quantitative standards are not available. Infrared spectroscopy has been used for many years to identify the compos...
Article
Thermo Electron Corporation's Smart Orbit natural diamond ATR accessory uses exclusively reflective optics. This permits easy access to the far-IR region as well as the traditional mid-IR in an ATR application.
Conference Paper
Full-text available
The spettroscopy IR to transformed of Fourier it has been used for the determination of the content of quartz of raw materials coming from the iron compartment. The achieved results have been compared with those consequential by the analysis to the X-ray diffractometry (XRD). The analysis of the results underlines an elevated correlation among quan...
Conference Paper
Full-text available
La spettroscopia IR a trasformata di Fourier è stata utilizzata per la determinazione del contenuto di quarzo di materie prime provenienti dal comparto siderurgico. I risultati conseguiti sono stati confrontati con quelli derivanti dall’analisi al diffrattometro a raggi X (DRX). L’analisi dei risultati evidenzia una elevata correlazione tra quantit...
Conference Paper
Full-text available
La spettroscopia IR a trasformata di Fourier è stata utilizzata per la determinazione del contenuto di quarzo di materie prime provenienti dal comparto siderurgico. I risultati conseguiti sono stati confrontati con quelli derivanti dall’analisi al diffrattometro a raggi X (DRX). L’analisi dei risultati evidenzia una elevata correlazione tra quantit...
Article
It is well known that, as device geometries continue to shrink, contaminants such as micro particles as well as metallic and organic contaminants have an ever-increasing impact on device yields. Therefore their detection and identification are of great importance for the microelectronics industry. In this work, the possibility to detect surface con...

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