
Federico IzziaProtochips · Marketing
Federico Izzia
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Publications
Publications (10)
The present application is directed to a novel spectrometer configured with a built-in attenuated total reflectance (ATR) and accessory compartment. In particular, an arranged sample analysis compartment provided by the spectrometer performs attenuated total reflectance analysis of a sample and includes a crystal, a tip configured to press the samp...
A method and corresponding apparatus provide correction of chemical images collected with a germanium hemisphere ATR microscope. A model is developed for rays passing through a simulated germanium (Ge) hemisphere attenuated total reflection (ATR) microscope. The model determines a data set for rays reaching the detector plane. Movement of the hemis...
Many analytical challenges to modern laboratories involve mixtures, whether formulated or contaminated. The infrared spectra of mixtures exhibit peaks from each component, making separation of peaks due to specific components an essential part of the analysis. This can be accomplished in two ways - spatial separation of components through microscop...
With new image analysis software for infrared spectroscopy, semi-quantitative studies can be performed without the use of standards providing rapid measurements of component concentrations when an approximate value is suitable or when quantitative standards are not available. Infrared spectroscopy has been used for many years to identify the compos...
Thermo Electron Corporation's Smart Orbit natural diamond ATR accessory uses exclusively reflective optics. This permits easy access to the far-IR region as well as the traditional mid-IR in an ATR application.
The spettroscopy IR to transformed of Fourier it has been used for the determination of the content of quartz
of raw materials coming from the iron compartment. The achieved results have been compared with those
consequential by the analysis to the X-ray diffractometry (XRD). The analysis of the results underlines an
elevated correlation among quan...
La spettroscopia IR a trasformata di Fourier è stata utilizzata per la determinazione del contenuto di quarzo
di materie prime provenienti dal comparto siderurgico. I risultati conseguiti sono stati confrontati con quelli
derivanti dall’analisi al diffrattometro a raggi X (DRX). L’analisi dei risultati evidenzia una elevata correlazione
tra quantit...
La spettroscopia IR a trasformata di Fourier è stata utilizzata per la determinazione del contenuto
di quarzo di materie prime provenienti dal comparto siderurgico. I risultati conseguiti sono
stati confrontati con quelli derivanti dall’analisi al diffrattometro a raggi X (DRX). L’analisi dei
risultati evidenzia una elevata correlazione tra quantit...
It is well known that, as device geometries continue to shrink, contaminants such as micro particles as well as metallic and
organic contaminants have an ever-increasing impact on device yields. Therefore their detection and identification are of
great importance for the microelectronics industry. In this work, the possibility to detect surface con...