Dourati Ahamed

Dourati Ahamed
Laboratoire National de Métrologie et d'Essais · Department of Information Technology

About

2
Publications
184
Reads
How we measure 'reads'
A 'read' is counted each time someone views a publication summary (such as the title, abstract, and list of authors), clicks on a figure, or views or downloads the full-text. Learn more
1
Citation

Publications

Publications (2)
Poster
Full-text available
In 2018, LNE’s metrological atomic force microscope (mAFM) performed its very first calibrations on standards developed at LNE (P600H60) in collaboration with C2N (Centre for Nanoscience and Nanotechnology). It provides a French traceability route to the SI meter for dimensional measurement at nanometer scale for calibration of standards commonly u...
Conference Paper
Full-text available
The LNE has developed its own metrological atomic force microscope (mAFM) which is now the French reference instrument for the measurement of AFM and SEM standards. This instrument uses four double path differential interferometers to measure the XYZ position of the tip relative to the sample. The measurement uncertainties of the mAFM were evaluate...

Projects

Project (1)
Project
The LNE’s metrological Atomic Force Microscope (mAFM) is the French reference instrument for calibrating standards dedicated to Scanning Probe Microscope (SPM) and Scanning Electron Microscope (SEM). On this instrument, the relative position of the tip with respect to the sample is measured in real time by interferometry in order to achieve direct traceability to the SI.