Daewon Moon

Daewon Moon
Daegu Gyeongbuk Institute of Science and Technology | DGIST · Department of New Biology

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9
Publications
3,190
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257
Citations
Citations since 2016
4 Research Items
215 Citations
2016201720182019202020212022010203040
2016201720182019202020212022010203040
2016201720182019202020212022010203040
2016201720182019202020212022010203040

Publications

Publications (9)
Article
Medium‐energy ion scattering (MEIS) has been used for quantitative depth profiling with single atomic layer resolution to determine the composition, thickness, and interface structure of ultrathin films and nanoparticles. To assure the consistency of the MEIS analysis, an international round‐robin test (RRT) with nominally 1‐, 3‐, 5‐, and 7‐nm thic...
Article
Medium energy ion scattering (MEIS) has been used for quantitative depth profiling of ultrathin films with single atomic layer resolution. To assure the consistency of the MEIS analysis, an international round-robin test with nominally 1, 3, 5, and 7 nm thick HfO2 films was conducted among 12 institutions. The standard deviations were 5.3% for the...
Article
One of the remaining challenges in material chemistry is to unveil the quantitative compositional/structural information and thermodynamic nature of inorganic materials especially in the initial nucleation and growth step. In this report, we adopted newly developed time-of-flight medium-energy-ion-scattering (TOF-MEIS) spectroscopy to address this...
Article
Medium Energy Ion Scattering (MEIS) has been successfully used for ultrathin film analysis such as gate oxides and multilayers due to its single atomic depth resolution in compostional and structural depth profiling. Recently, we developed a time-of-flight (TOF) MEIS for the first time, which can analyze a 10?m small spot. Small spot analysis would...
Article
We report the quantitative compositional profiling of 3-5 nm CdSe/ZnS quantum dots (QDs) conjugated with a perfluorooctanethiol (PFOT) layer using the newly developed time-of-flight (TOF) medium-energy ion scattering (MEIS) spectroscopy with single atomic layer resolution. The collection efficiency of TOF-MEIS is 3 orders of magnitude higher than t...
Article
Full-text available
This review examines characterization challenges inherently associated with understanding nanomaterials and the roles surface and interface characterization methods can play in meeting some of the challenges. In parts of the research community, there is growing recognition that studies and published reports on the properties and behaviors of nanoma...
Article
The Er3+ luminescent properties of Er-doped Si/SiO2 superlattices are investigated. The superlattices were deposited either by electron cyclotron resonance plasma enhanced chemical vapor deposition or by ultra-high vacuum ion beam sputter deposition method and subsequently annealed at 950 degrees C. The thickness of the layers was varied 0.6 to 4.8...

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