Austin Day

Austin Day
Aunt Daisy Scientific Ltd · Research and Development

PhD

About

41
Publications
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1,615
Citations

Publications

Publications (41)
Article
Electron backscatter diffraction is a scanning electron microscopy technique used to obtain crystallographic information on materials. It allows the nondestructive mapping of crystal structure, texture, and strain with a lateral and depth resolution on the order of tens of nanometers. Electron backscatter diffraction patterns (EBSPs) are presently...
Article
Full-text available
Two very different aspects of electron backscatter diffraction (EBSD) are considered in this paper. Firstly, the use of the technique for the measurement of grain size is discussed with particular reference to the development of international standards to help ensure reproducible and repeatable measurements. In particular the lessons learnt for bot...
Article
Full-text available
of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Article
Threading dislocations, stacking faults, and associated partial dislocations significantly degrade the optical and electrical properties of materials such as non-polar III-nitride semiconductor thin films. Stacking faults are generally difficult to detect and quantify with existing characterization techniques. We demonstrate the use of electron cha...
Article
Full-text available
of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Article
We describe the use of electron channeling contrast imaging in the scanning electron microscope to rapidly and reliably image and identify threading dislocations (TDs) in materials with the wurtzite crystal structure. In electron channeling contrast imaging, vertical TDs are revealed as spots with black-white contrast. We have developed a simple ge...
Article
We describe the use of electron channelling contrast imaging (ECCI) – in a field emission scanning electron microscope (SEM) – to reveal and identify defects in nitride semiconductor thin films. In ECCI changes in crystallographic orientation, or changes in lattice constant due to local strain, are revealed by changes in grey scale in an image cons...
Article
For precise orientation and strain measurements, advanced Electron Backscatter Diffraction (EBSD) techniques require both accurate calibration and reproducible measurement of the system geometry. In many cases the pattern centre (PC) needs to be determined to sub-pixel accuracy. The mechanical insertion/retraction, through the Scanning Electron Mic...
Article
High resolution EBSD directly compares electron backscattering patterns (EBSPs), generated in a scanning electron microscope, to measure relative strain and rotation to a precision of ∼ 10(-4) in strain and 10(-4)rad (0.006 °) in rotation. However the measurement of absolute strain and rotation requires reference EBSPs of known strain and orientati...
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Full-text available
Instrumentation and Techniques SymposiaFuture Prospects for SEM-based Defect Analysis using Fast ElectronsArticle author querypicard y [PubMed] [Google Scholar]kamaladasa r [PubMed] [Google Scholar]kumar n [PubMed] [Google Scholar]trager-cowan c [PubMed] [Google Scholar]jiang w [PubMed] [Google Scholar]skowronski m [PubMed] [Google Scholar]sa...
Chapter
Spheres, or, more accurately, spherical surfaces are important for electron backscatter diffraction (EBSD). Electron backscatter patterns (EBSPs), and pole figure and misorientation axis data are ideally suited to display on the surface of a sphere. Spherical Kikuchi maps (SKMs) are a simple means to display the full diffrac-tion pattern for Elect...
Article
This comment on the paper "Bragg's Law diffraction simulations for electron backscatter diffraction analysis" by Kacher et al. explains the limitations in determining elastic strains using synthetic EBSD patterns. Of particular importance are those due to the accuracy of determination of the EBSD geometry projection parameters. Additional reference...
Article
of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Article
Spheres, or more usually spherical surfaces, are important in electron backscatter diffraction. Both electron backscatter patterns (EBSPs) and pole figure texture data are more accurately represented on the spherical surface, S(2); and unit quaternions, which are the optimal method for orientation calculations, exist on the surface of the hypersphe...
Article
We present an approach for the simulation of complete electron backscatter diffraction (EBSD) patterns where the relative intensity distributions in the patterns are accurately reproduced. The Bloch wave theory is applied to describe the electron diffraction process. For the simulation of experimental patterns with a large field of view, a large nu...
Article
In this paper we describe the use of electron backscatter diffraction (EBSD) mapping and electron channeling contrast imaging-in the scanning electron microscope-to study tilt, atomic steps and dislocations in epitaxial GaN thin films. We show results from a series of GaN thin films of increasing thickness and from a just coalesced epitaxial latera...
Article
In the present paper the authors describe the use of electron backscatter diffraction (EBSD) mapping and electron channelling contrast imaging (in the scanning electron microscope) to study tilt, strain, atomic steps and dislocations in epitaxial GaN thin films. Results from epitaxial GaN thin films and from a just coalesced epitaxial laterally ove...
Article
Three-dimensional (3D) microscopy is a new and rapidly expanding area. A DualBeam system, with both a focused ion beam (FIB) column and an electron column, is a powerful instrument for imaging and sectioning microstructures to generate a full 3D sample reconstruction. When an electron backscatter diffraction (EBSD) system is attached to the DualBea...
Article
Orientation mapping using automated electron backscatter diffraction (EBSD) is now a common technique for characterizing microstructures. Improvements in software and hardware have resulted in high-speed mapping capabilities above 80,000 points h(-1). For 'routine' microstructural analyses of materials such as steel and aluminium (e.g. texture and...
Article
An oscillating viscometer with the following features has been successfully constructed: improved detection of the logarithmic decay curve of oscillation through the introduction of a system with a 40-diode array; use of the Roscoe equation to derive viscosities from the decay curve; the introduction of a high-temperature two-zone furnace to provid...
Article
Full-text available
In a scanning electron microscope (SEM) an electron beam sets up an omni-directional source of scattered electrons within a specimen. Diffraction of these electrons will occur simultaneously on all lattice planes in the sample and the backscattered electrons (BSE), which escape from the specimen, will form a diffraction pattern that can be imaged o...
Article
The problems associated with the definition of a grain, grain size measurement, and the issues associated with making one- and two-dimensional measurements on a three-dimensional structure are discussed. The relatively new scanning electron microscope (SEM)-based techniques of colour orientation contrast imaging (COCI) and automated electron backsc...
Article
The surface tensions of liquid metals can be derived from measurements of the natural oscillation frequencies of levitated drops through the Rayleigh relation, y = \frac38pmw2 y = \frac{3}{8}\pi m\omega ^2 In general, during terrestrial measurements, a spectrum consisting of three to five dominant oscillation frequencies (in the range of 30 to 6...
Article
Experimental methods have been developed for the measurement of the physical properties of commercial alloys needed for the mathematical modelling of high temperature processes such as spray forming and atomisation.
Article
Measuring grain size is not always easy, and results can be misleading. Paper describes the maze of old and new techniques available to size up those grain. New techniques based on the electron microscope, such as orientation/channeling contrast imaging and electron backscatter diffraction (EBSD), offer useful alternatives to conventional metallogr...
Article
Measurement methods are being developed to provide values for the density, viscosity, heat capacity, enthalpy, fraction solid, surface tension, and thermal diffusivity and conductivity of commercial alloys in the liquid and mushy states. These data are needed for the mathematical modeling of heat and fluid flow in solidification processes. This pap...
Article
Nickel base superalloy and aluminium single crystal and polycrystalline specimens have been examined using mechanical property microprobe (MPM) measurements and electron backscatter patterns (EBSPs) as a function of applied strain. Grids of lines deposited on to the specimens before three point bending were used to determine the macroscopic strain....
Article
This paper is a guide to the Rodrigues vector and Rodrigues–Frank space for the representation of populations of orientations and misorientations, as measured individually by techniques such as electron backscatter diffraction in a scanning electron microscope. All the essential steps for use of the Rodrigues vector approach are clearly explained a...
Article
In order to study the mechanism of grain boundary (GB) cracking in fatigued polycrystalline copper, specimens were fatigued in symmetrical push-pull at an intermediate constant plastic strain range at room temperature in dry air. The intergranular cracks were examined under the scanning electron microscope. Many GB cracks were found to have been fo...
Article
The device industry is entering a period characterized by the introduction of a number of new materials associated with multilayer structures. These structures are themselves being developed for use in sub-micron VLSI. A variety of new compounds and alloys such as Ti/W, nitrides and silicides are being introduced as barrier layers to overcome probl...
Article
Full-text available
Although Dauphiné Twinning (DT) in quartz has been described as a result of stresses applied on the mineral aggregates since 1970 [1,2], there are only few studies where it has been characterized an important deformational feature in the rocks [3,4,5,6,7], possibly due to the inability to recognize it as such in the optical microscope. Those featur...

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