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70
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Introduction
I am a creative (writing, voice acting, music, art) who self-publishes.
I was a materials engineer with a focus on materials characterisation using atom probe microscopy. My previous experience was in software engineering, and I combine these areas to develop novel analysis techniques to understand structure-property relationships in materials.
Education
March 2006 - March 2011
The University of Sydney
Field of study
- Atom probe microscopy
March 1998 - November 2001
Publications
Publications (70)
Pair distribution function (PDF) analysis is a powerful technique to understand atomic scale structure in materials science. Unlike X-ray diffraction (XRD)-based PDF analysis, the PDF calculated from electron diffraction patterns (EDPs) using transmission electron microscopy can provide structural information from specific locations with high spati...
Zr-based bulk metallic glasses (BMGs) are amorphous alloys that can exhibit excellent mechanical properties, including high yield strength and fracture toughness. These properties are linked to local microstructural heterogeneities. Whether via microscopy-based techniques, synchrotron techniques, or calorimetric approaches, the amorphous structure...
Bulk metallic glasses (BMGs) naturally have excellent strength and elasticity while structural rejuvenation into higher energy glassy states is often required to improve ductility. However, our understanding of the detailed atomic ordering changes that occur during rejuvenation processes, such as plastic deformation, remains limited. This study uti...
Thermal annealing temperature and time dictate the microstructure of semiconductor materials such as silicon nanocrystals (Si NCs). Herein, atom probe tomography (APT) and density functional theory (DFT) calculations are used to understand the thermal annealing temperature effects on Si NCs grown in a SiO 2 matrix and the distribution behaviour of...
Atom probe tomography, and related methods, probe the composition and the three-dimensional architecture of materials. The software tools which microscopists use, and how these tools are connected into workflows, make a substantial contribution to the accuracy and precision of such material characterization experiments. Typically, we adapt methods...
Bulk metallic glasses (BMGs) are materials with outstanding strength and elastic properties that make them tantalizing for engineering applications, yet our poor understanding of how their amorphous atomic arrangements control their broader mechanical properties (hardness, wear, fracture, etc.) impedes our ability to apply materials science princip...
Current reconstruction methodologies for atom probe tomography (APT) contain serious geometric artifacts that are difficult to address due to their reliance on empirical factors to generate a reconstructed volume. To overcome this limitation, a reconstruction technique is demonstrated where the analyzed volume is instead defined by the specimen geo...
The microstructure of boron (B) and phosphorus (P) codoped silicon (Si) nanocrystals (NCs), cubic boron phosphide (BP) NCs and their mixed NCs (BxSiyPz NCs) has been studied using atom probe tomography (APT), transmission electromicroscopy (TEM), and Raman scattering spectroscopy. The BxSiyPz NCs inherit superior properties of B and P codoped Si NC...
Modification of the recently developed creep-resistant Mg-3Gd-2Ca (wt.%) magnesium alloy using Nd and Mn remarkably improved the creep resistance at both 180 °C and 210 °C. The modified Mg-2Gd-1Nd-2Ca-0.5Mn alloy after solid solution treatment exhibited outstanding creep resistance that is superior to the commercial creep-resistant Mg alloy, EV31,...
The present work studies the strengthening mechanisms of a creep-resistant Mg-0.5Gd-1.2Ca (at.%) alloy at both room and elevated temperatures. Although peak-ageing (T6) at 180 °C for 32 h led to a significant increase in room temperature strength due to the precipitation strengthening by three types of precipitates (Mg2Ca, Mg5Gd on prismatic planes...
Atom probe tomography (APT) is a microscopy technique that provides a unique combination of information, specifically the position and elemental identity of each atom in three dimensions. Although the mass and spatial resolution is not perfect, we are still able to gain insights into materials science questions that we cannot access using other tec...
Improving Spatial Accuracy in Atom Probe Tomography through a Crystallography-Mediated Reconstruction (CMR) - Volume 25 Supplement - A.C. Day, A. V. Ceguerra, S.P. Ringer
Interpreting the Simplified Multicomponent Short-Range Order Parameter - Volume 25 Supplement - William J. Davids, Anna V. Ceguerra, Simon P. Ringer
Boron (B) and phosphorous (P) co-doped colloidal silicon nanocrystals (Si NCs) have unique size-dependent optical properties, which lead to potential applications in optoelectronic and biomedical applications. However, the microstructure of the B and P co-doped colloidal Si NCs – in particular, the exact location of the dopant atoms in real space,...
In this study, the microstructure and mechanical properties, especially the impacts of low-temperature tempering, of the medium-Mn martensitic steel were examined. The low-temperature tempering simulated paint baking in car manufacturing. Significant improvement of tensile ductility was achieved by baking, associating with a change from brittle to...
Recent advancements in data mining methods in atom probe microscopy have enabled new quantitative chemical and microstructural characterization beyond the standard three-dimensional reconstruction. For example, spatial distribution maps have been developed to enable visualisation of the local lattice occupation of a selected region of interest. How...
We define a measure for the accuracy of tomographic reconstruction in atom probe tomography, named here the spatial error index. We demonstrate that this index can be used to compare rigorously the spatial accuracy of various different approaches to the calculation of tomographic reconstruction. This is useful, for example, to evaluate the performa...
Current approaches to reconstruction in atom probe tomography produce results that exhibit substantial distortions throughout the analysis depth. This is largely because of the need to apply a multitude of assumptions when estimating the evolution of the tip shape, and other pseudo-empirical reconstruction factors, which vary both across the face o...
The structural and chemical changes at ω/β interfaces and the evolution of the morphology of ω in a near-β alloy during isothermal ageing at 573 K were investigated by atom probe tomography and aberration-corrected high-resolution transmission electron microscopy. Ledges and local O enrichment at semi-coherent isothermal ω interfaces are proposed t...
Grain size stabilization is crucial for the production and application of nanocrystalline (NC) materials. The mechanically alloyed (MA) NC Fe-Zr system is known as a very successful NC system as it exhibits excellent thermal stability at elevated temperatures. The grain size stabilization of this system has been previously ascribed to its reduced g...
String-shaped morphologies consisting of preferentially aligned lath-shaped α precipitates were observed in the metastable β Ti-6Cr-5Mo-5V-4Al alloy after deformations at high strain rates and elevated temperatures. The morphology and 3-dimentional arrangement of this feature have been elaborated based on the characterizations via a combination of...
Atom probe tomography is a powerful microscopy technique capable of reconstructing the 3D position and chemical identity of millions of atoms within engineering materials, at the atomic level. Crystallographic information contained within the data is particularly valuable for the purposes of reconstruction calibration and grain boundary analysis. T...
The split quenching and partitioning (S-QP) process allows researchers to investigate microstructure and properties separately, i.e., before and after partitioning. After the partitioning process, the yield strength increases by approximately 300 MPa in the ferrite-bearing δ-quenching and partitioning (δ-QP) steel. We propose that carbon trapping i...
Atom probe tomography was used to analyse self-assembled monolayers of thiophene on different surfaces, including tungsten, platinum and aluminium, where the tungsten was examined in both pristine and oxidised forms. A glove bag with controlled atmospheres was used to alter the level of oxidation for tungsten. It was shown that different substrates...
Thin films consisting of silicon nanocrystals fabricated by high silicon content in silicon rich oxide show unique properties of decreasing resistivity and increasing light absorption while maintaining quantum confinement effects. With that said, the effect of the annealing temperature and doping element on the microscopic structure of silicon nano...
Solute clusters affect the physical properties of alloys. Knowledge of the atomic structure of solute clusters is a prerequisite for material optimisation. In this study, solute clusters in a rapid-hardening Al-Cu-Mg alloy were characterised by a combination of atom probe tomography and density functional theory, making use of a hybrid data type th...
Solute clusters affect the physical properties of alloys. Knowledge of the atomic structure of solute clusters is a prerequisite for material optimisation. In this study, solute clusters in a rapid-hardening Al-Cu-Mg alloy were characterised by a combination of atom probe tomography and density functional theory, making use of a hybrid data type th...
A lightweight (5.06 g cm À3) AlTiVCr compositionally complex alloy consisting of four elements is presented. Interest in the system is due to its microstructural uniformity and the use of commodity elements. The focus of the present work was to highlight the systematic microstructural and chemical characterization e and the information gained by ap...
Doping of silicon nanocrystals is essential to control their electronic and optical properties. The incorporation of an impurity into a silicon nanovolume is a nontrivial task due to the self-purification effect. Here, a systematic atom probe tomography study of the phosphorus distribution and incorporation in size-controlled silicon nanocrystals e...
Intrinsic, boron (B)-doped, and phosphorus (P)-doped silicon nanocrystals (Si NCs) formed from an excess Si concentration of 40 at. % were investigated to study their structural, optical, and electrical properties. Atom probe tomography (APT) revealed that the size and arrangement of Si NCs were different in each sample. A strong blue shift in phot...
Atom probe tomography of phosphorus- and boron-doped silicon nanocrystals with various compositions of silicon rich oxide — ERRATUM - Keita Nomoto, Sebastian Gutsch, Anna V. Ceguerra, Andrew Breen, Hiroshi Sugimoto, Minoru Fujii, Ivan Perez-Wurfl, Simon P. Ringer, Gavin Conibeer
We analyze phosphorus (P)- and boron (B)-doped silicon nanocrystals (Si NCs) with various compositions of silicon-rich oxide using atom probe tomography. By creating Si iso-concentration surfaces, it is confirmed that there are two types of Si NC networks depending on the amount of excess Si. A proximity histogram shows that P prefers to locate ins...
Silicon nanocrystals (Si NCs) are intensively studied for optoelectronic and biological applications due to having highly attractive features such as band engineering. Although doping is often used to control the optical and electrical properties, the related structural properties of solely-doped and co-doped Si NCs are not well understood. In this...
Materials that undergo a reversible change of crystal structure through martensitic transformation (MT) possess unusual functionalities including shape memory, superelasticity, and low/negative thermal expansion. These properties have many advanced applications, such as actuators, sensors, and energy conversion, but are limited typically in a narro...
For multicomponent near-β alloys, we have investigated the mechanisms responsible for the β-to-ω and ω-to-α phase transformations upon isothermal ageing at 573 K. Experimental evidence from atom probe tomography and aberration-corrected high-resolution transmission electron microscopy indicates that the formation of isothermal ω involves a structur...
We study an Fee18Al (at.%) alloy after various thermal treatments at different times (24e336 h) and temperatures (250e1100 C) to determine the nature of the so-called 'komplex' phase state (or "K-state"), which is common to other alloy systems having compositions at the boundaries of known order-disorder transitions and is characterised by heteroge...
div class="title">The Use of Online Tools in Microscopy and Microanalysis Core Facilities
- Volume 21 Issue S3 - Miles Apperley, Jenny Whiting, Bronwen Cribb, Anna Ceguerra
The following manuscript presents a novel approach for creating lattice based models of Sb-doped Si directly from atom probe reconstructions for the purposes of improving information on dopant positioning and directly informing quantum mechanics based materials modeling approaches. Sophisticated crystallographic analysis techniques are used to dete...
Short-range-order (SRO) has been quantitatively evaluated in an Fe-18Al (at%) alloy using atom probe tomography (APT) data and by calculation of the generalised multicomponent short-range order (GM-SRO) parameters, which have been determined by shell-based analysis of the three-dimensional atomic positions. The accuracy of this method with respect...
This new alternate approach to data processing for analyses that traditionally employed grid-based counting methods is necessary because it removes a user-imposed coordinate system that not only limits an analysis but also may introduce errors. We have modified the widely used “binomial” analysis for APT data by replacing grid-based counting with c...
Microscopy encompasses a wide variety of forms and scales. So too does the array of simulation techniques developed that correlate to and build upon microstructural information. Nevertheless, a true nexus between microscopy and atomistic simulations is lacking. Atom probe has emerged as a potential means of achieving this goal. Atom probe generates...
For a scientist in the modern era, reliability of results is no longer the key to a successful career in research. Increasingly, scientists must demonstrate the applicability (e.g. usefulness) of their work, as well as ensure the research is accessible (e.g. easy to find and easy to interpret). It is these three traits that define how others percei...
Much effort has been devoted to the development of computational techniques in atom probe microscopy over the past decade. There have been several drivers for this effort. Firstly, there has been effort devoted to addressing the challenges of discerning information from the increasingly large size of the data, and capturing the opportunities that t...
of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
In this paper we present new methods for feature analysis in atom probe tomography data that have useful applications in materials characterisation. The analysis works on the principle of Voronoi subvolumes and piecewise linear approximations, and feature delineation based on the distance to the centre of mass of a subvolume (DCOM). Based on the co...
Two methods for separating the constituent atoms of molecular ions within atom probe tomography reconstructions are presented. The Gaussian Separation Method efficiently deconvolutes molecular ions containing two constituent atoms and is tested on simulated data before being applied to an experimental HSLA steel dataset containing NbN. The Delaunay...
Controllable doping of semiconductor nanowires is critical to realize their proposed applications, however precise and reliable characterization of dopant distributions remains challenging. In this article, we demonstrate an atomic-resolution three-dimensional elemental mapping of pristine semiconductor nanowires on growth substrates by using atom...
The generalized multicomponent short-range order (GM-SRO) parameter has been adapted for the characterization of short-range order within the highly chemically and spatially resolved three-dimensional atomistic images provided by the microscopy technique of atom-probe tomography (APT). It is demonstrated that, despite the experimental limitations o...
In order to unravel the magnetism of Co-doped ZnO films, we have performed rigorous experiments on Co-doped ZnO grown onO-polar ZnO (000(1) over bar) substrates by molecular beam epitaxy. We find that the ZnO:Co with Co composition less than 20% is paramagnetic even at low temperatures, whereas that with Co composition of 20% shows ferromagnetism a...
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7 – August 11, 2011.
Atom probe tomography (APT) represents a significant step toward atomic resolution microscopy, analytically imaging individual atoms with highly accurate, though imperfect, chemical identity and three-dimensional (3D) positional information. Here, a technique to retrieve crystallographic information from raw APT data and restore the lattice-specifi...
Whereas the atom probe is regarded almost exclusively as a technique for 3D chemical microanalysis of solids with the highest chemical and spatial resolution, we demonstrate that the technique can be used for detailed crystallographic determinations. We present a new method for the quantitative determination of crystal structure (plane spacings and...
This Brief Report introduces a short-range order parameter, called the generalized multicomponent short-range order (GM-SRO) parameter. The application to Monte Carlo simulations is described for higher order solid solutions. The results show the ability to create atomic-scale systems with a particular subset of the GM-SRO parameters and the power...
Solute clustering is increasingly recognised as a significant characteristic within certain material systems that can be tailored to the optimization of bulk properties and performance. Atom probe tomography (APT) is emerging as a powerful tool for the detection of these nanoscale features; however, complementary to experiment, precise and efficien...
The advent of Local Electrode Atom Probe (LEAP) tomography is revolutionizing materials science by enabling near atomic scale imaging of materials. Analysis of three-dimensional atom probe tomography (APT) data holds the promise of relating combinatorial arrangement of atoms to material properties and enable better design and synthesis of complex m...
The applicability of the binomial frequency distribution is outlined for the analysis of the evolution nanoscale atomic clustering of dilute solute in an alloy subject to thermal ageing in 3D atom probe data. The conventional chi(2) statistics and significance testing are demonstrated to be inappropriate for comparison of quantity of solute segrega...
of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007
This paper presents an application of Learning Vector Quantization (LVQ) neural network (NN) to Automatic Fingerprint Verification (AFV). The new approach is based on both local (minutiae) and global image features (shape signatures). The matched minutiae are used as reference axis for generating shape signatures which are then digitized to form a...
This paper presents a new approach for combining local and global recognition schemes for automatic fingerprint verification (AFV), by using matched local features as the reference axis for generating global features. In our specific implementation, minutia-based and shape-based techniques were combined. The first one matches local features (minuti...
Questions
Question (1)
For example, I have 5 samples where each sample varies one parameter, and 10 experiments per sample. So for each sample, I have a mean and a standard deviation.
I plot the mean versus the parameter that's varied, and I calculate a linear fit with a slope, intercept, and root mean squared error (RMSE).
I calculate a value (W) based on the slope and intercept.
How do I combine the standard deviation of each sample, and the RMSE of the linear fit, so I can report an error on W?