Ultramicroscopy (ULTRAMICROSCOPY)

Publisher: Microscopy Society of America; Israel Society for Microscopy; Scandinavian Society for Electron Microscopy; Netherlands Society of Electron Microscopy; Swiss Society for Electron Microscopy; All authors, Elsevier

Journal description

Scientists engaged in ultrastructure research seem to fall into two overlapping categories. One group uses existing tools and methods to advance knowledge in particular disciplines. The second group is committed to advancing the tools and methods themselves. For the benefit of both groups, this work finds its outlet in Ultramicroscopy, a journal initiated to provide a forum for investigators and to concentrate otherwise widely dispersed knowledge, promoting cross-fertilization between the two groups. This communication between developer and user covers all aspects - fundamental and technical - pertaining to ultramicroscopic elucidation of structure, ranging from particle optics to radiation interaction.

Current impact factor: 2.44

Impact Factor Rankings

2016 Impact Factor Available summer 2017
2014 / 2015 Impact Factor 2.436
2013 Impact Factor 2.745
2012 Impact Factor 2.47
2011 Impact Factor 2.471
2010 Impact Factor 2.061
2009 Impact Factor 2.067
2008 Impact Factor 2.629
2007 Impact Factor 1.996
2006 Impact Factor 1.706
2005 Impact Factor 2.49
2004 Impact Factor 2.215
2003 Impact Factor 1.665
2002 Impact Factor 1.772
2001 Impact Factor 1.89
2000 Impact Factor 1.695
1999 Impact Factor 2.244
1998 Impact Factor 2.045
1997 Impact Factor 1.6

Impact factor over time

Impact factor

Additional details

5-year impact 2.47
Cited half-life 7.70
Immediacy index 0.92
Eigenfactor 0.01
Article influence 0.93
Website Ultramicroscopy website
Other titles Ultramicroscopy (Online)
ISSN 0304-3991
OCLC 39196475
Material type Document, Periodical, Internet resource
Document type Internet Resource, Computer File, Journal / Magazine / Newspaper

Publisher details


  • Pre-print
    • Author can archive a pre-print version
  • Post-print
    • Author can archive a post-print version
  • Conditions
    • Authors pre-print on any website, including arXiv and RePEC
    • Author's post-print on author's personal website immediately
    • Author's post-print on open access repository after an embargo period of between 12 months and 48 months
    • Permitted deposit due to Funding Body, Institutional and Governmental policy or mandate, may be required to comply with embargo periods of 12 months to 48 months
    • Author's post-print may be used to update arXiv and RepEC
    • Publisher's version/PDF cannot be used
    • Must link to publisher version with DOI
    • Author's post-print must be released with a Creative Commons Attribution Non-Commercial No Derivatives License
    • Publisher last reviewed on 03/06/2015
  • Classification

Publications in this journal

  • [Show abstract] [Hide abstract]
    ABSTRACT: In this paper improvements to a Near-Field Scanning Microwave Microscope (NSMM) are presented that allow the loss of high loss dielectric materials to be measured accurately at microwave frequencies. This is demonstrated by measuring polar liquids (loss tangent tanδ≈1) for which traceable data is available. The instrument described uses a wire probe that is electromagnetically coupled to a resonant cavity. An optical beam deflection system is incorporated within the instrument to allow contact mode between samples and the probe tip to be obtained. Liquids are contained in a measurement cell with a window of ultrathin glass. The calibration process for the microscope, which is based on image-charge electrostatic models, has been adapted to use the Laplacian ‘complex frequency’. Measurements of the loss tangent of polar liquids that are consistent with reference data were obtained following calibration against single-crystal specimens that have very low loss.
    No preview · Article · Feb 2016 · Ultramicroscopy

  • No preview · Article · Dec 2015 · Ultramicroscopy
  • [Show abstract] [Hide abstract]
    ABSTRACT: A novel atomic force microscope (AFM) dual-probe caliper for critical dimension (CD) metrology has been developed. The caliper is equipped with two facing tilted optical fiber probes (OFPs) wherein each can be used independently to scan either sidewall of micro and nanostructures. The OFP tip with length up to 500μm (aspect ratio 10:1, apex diameter ⩾10nm) has unique features of scanning deep trenches and imaging sidewalls of relatively high steps with exclusive profiling possibilities. The caliper arms-OFPs can be accurately aligned with a well calibrated opening distance. The line width, line edge roughness, line width roughness, groove width and CD angles can be measured through serial scan of adjacent or opposite sidewalls with each probe. Capabilities of the presented AFM caliper have been validated through experimental CD measurement results of comb microstructures and AFM calibration grating TGZ3. Copyright © 2015 Elsevier B.V. All rights reserved.
    No preview · Article · Nov 2015 · Ultramicroscopy
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    ABSTRACT: We describe a fast and accurate method for the reconstruction of macromolecular complexes from a set of projections. Direct Fourier inversion (in which the Fourier Slice Theorem plays a central role) is a solution for dealing with this inverse problem. Unfortunately, the set of projections provides a non-equidistantly sampled version of the macromolecule Fourier transform in the single particle field (and, therefore, a direct Fourier inversion) may not be an optimal solution. In this paper, we introduce a gridding-based direct Fourier method for the three-dimensional reconstruction approach that uses a weighting technique to compute a uniform sampled Fourier transform. Moreover, the contrast transfer function of the microscope, which is a limiting factor in pursuing a high resolution reconstruction, is corrected by the algorithm. Parallelization of this algorithm, both on threads and on multiple CPU's, makes the process of three-dimensional reconstruction even faster. The experimental results show that our proposed gridding-based direct Fourier reconstruction is slightly more accurate than similar existing methods and presents a lower computational complexity both in terms of time and memory, thereby allowing its use on larger volumes. The algorithm is fully implemented in the open-source Xmipp package and is downloadable from http://xmipp.cnb.csic.es. Copyright © 2015 Elsevier B.V. All rights reserved.
    No preview · Article · Oct 2015 · Ultramicroscopy
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    ABSTRACT: Atomically resolved imaging of organic molecules consisting of thin crystals by aberration-corrected (AC) HRTEM was studied by experimental observations and image simulations. An atomically resolved image of the hexadecachlorophthalocyanatocopper (CuPcCl16) molecule was obtained under low-dose conditions. The conditions for imaging organic frameworks were found to be more restricted than those for heavier elements such as copper and chlorine. For the characterization of the benzene rings within CuPcCl16 molecules, the specimen thickness had to be less than ~5nm. The effects of the defocus conditions were examined by changing the image according to the location of the inclined specimen. The optimal defocus range for atomic resolution imaging of organic molecules was limited to a narrow region around the Scherzer defocus. Compared with scanning transmission microscopy, AC-HRTEM is more suitable for low-dose imaging, but the optimum conditions were severely restricted. Copyright © 2015 Elsevier B.V. All rights reserved.
    No preview · Article · Aug 2015 · Ultramicroscopy
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    ABSTRACT: A fast multi-slice image simulation by parallelized computation using a graphics processing unit (GPU) has been developed. The image simulation contains multiple sets of computing steps, such as Fourier transform and pixel-to-pixel operation. The efficiency of GPU varies depending on the type of calculation. In the effective case of utilizing GPU, the calculation speed is conducted hundreds of times faster than a central processing unit (CPU). The benchmark test of parallelized multi-slice was performed, and the results of contents, such as TEM imaging, STEM imaging and CBD calculation are reported. Some features of the simulation software are also introduced. Copyright © 2015 Elsevier B.V. All rights reserved.
    No preview · Article · Jul 2015 · Ultramicroscopy
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    ABSTRACT: Semiconductor nanowires have been intensively explored for applications in electronics, photonics, energy conversion and storage. A fundamental and quantitative understanding of growth-structure-property relationships is central to applications where nanowires exhibit clear advantages. Atom Probe Tomography (APT) is able to provide 3 dimensional quantitative elemental distributions at atomic-resolution and is therefore unique in understanding the growth-structure-property relationships. However, the specimen preparation with nanowires is extremely challenging. In this paper, two ion beam free specimen preparation methods for APT are presented which are efficient for various nanowires. Copyright © 2015 Elsevier B.V. All rights reserved.
    No preview · Article · Jun 2015 · Ultramicroscopy