(a) Multiple vibrational excitation (MVE) concept after Bravaix et al.¹ (b) Dual photo-carrier pulses (red) creating vibrational states (blue) leading to permanent degradation. The setup can resolve the MVE lifetime by comparing the permanent effects of (iii), (ii), and (i).

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Concept of the laser-induced hot-carrier accelerated degradation process.

Simplified diagram of the laser setup. A beam splitter splits the laser...

(a) Frequency degradation of RO structures aged by laser. The laser...

Left (solid red): Photocurrent recorded in double pulse configuration...

Laser-based FinFET hot-carrier degradation resolved in time-domain

Article

Full-text available

Mar 2025

R. Ascázubi
B. Ajdari

Hot-carrier degradation in contemporary FinFET transistors by means of ultrafast infrared laser pulses enable the study of the evolution of excited states leading to device degradation. Here, we present results from a time-resolved optical setup where additive populations of hot-carriers are photo-injected. We report the experimental observation of...