- Characterising a tunable, pulsed atomic beam using matter-wave interferometry

The profile of the grating slits. The schematic shows a cross section of three slits, defined by the dimensions of the Si3N4 substrate. The actual slit width, s 0, is an average value of the top and bottom slit widths.

Go to figure page

Reference

Characterising a tunable, pulsed atomic beam using matter-wave interferometry - Scientific Figure on ResearchGate. Available from: https://www.researchgate.net/figure/The-profile-of-the-grating-slits-The-schematic-shows-a-cross-section-of-three-slits_fig1_352112890 [accessed 27 Mar 2025]

Caption

The profile of the grating slits. The schematic shows a cross section of three slits, defined by the dimensions of the Si3N4 substrate. The actual slit width, s 0, is an average value of the top and bottom slit widths.

Embed code

<a href="https://www.researchgate.net/figure/The-profile-of-the-grating-slits-The-schematic-shows-a-cross-section-of-three-slits_fig1_352112890"><img src="https://www.researchgate.net/publication/352112890/figure/fig1/AS:1132496754360333@1647019675694/The-profile-of-the-grating-slits-The-schematic-shows-a-cross-section-of-three-slits.jpg" alt="The profile of the grating slits. The schematic shows a cross section of three slits, defined by the dimensions of the Si3N4 substrate. The actual slit width, s 0, is an average value of the top and bottom slit widths."/></a>