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Reflectivity spectra of bulk copper surfaces cleaned by various methods: ◆, freshly deposited film; ■, polished disk; ●, chemically cleaned sheet; ▲, HNO3-etched sheet; ▼, as-received sheet.
Source publication
A simple technique utilizing a bifurcated fiber light guide for obtaining the reflectivity spectra of specular and diffusely reflecting surfaces is described. The technique can be used in certain situations where conventional reflectometers are not practical.
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Citations
A method and apparatus is developed to monitor nondestructively the turbidity of colorless bulk material. The method employs illumination and measuring spots of equal and small sizes (radius r m ) at the same site of the sample surface. The Kubelka-Munk scattering coefficient may be measured in nonabsorbing material but calibration is necessary. The range then is approximately 1/(8r m ) < S < 10/r m . A flexibly connected miniature measuring head (r m ≃ 0.13 mm) is connected to a lamp-detector unit by optical fibers. Polychromatic light from a xenon lamp is used. The present apparatus is especially designed for dental research, but biological tissues and also commercially available liquids, papers, and plastics can be monitored for their scattering behavior.
The thicknesses of UO2 films from 100 Å to 1800 Å on uranium substrates were determined from reflectance measurements in the visible region. The reflectance measurements on the U–UO2 system were analyzed by two different methods to determine film thicknesses. In the first method, film thicknesses were determined by comparing theoretical reflectance calculations with the experimental reflectance measurements. In the second method, film thicknesses were determined by obtaining the best match of the colorimetric properties (wavelength, excitation purity, and luminous reflectance) of the sample with the colorimetric properties of a predetermined film thickness calibration curve.
