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Raman Spectra of WSe2 crystal and thin films.  

Raman Spectra of WSe2 crystal and thin films.  

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An excellent candidate for an earth abundant absorber material is WSe2 which can be directly grown as a p-type semiconductor with a band gap near 1.4 eV. In this work we present the structural, optical, and electrical properties of thin film WSe2 grown via the selenization of sputter deposited tungsten films. We will show that highly textured films...

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... Mao et al. [27] similarly developed a WSe 2 thin film to investigate the photoelectric properties of the thin film. Ma et al. [28] also got a similar type of GIXRD pattern. The high intensity of the plane (0 0 2) refers to the orientation of the thin film growth towards the c-axis i.e., growth is perpendicular to the substrate and the same pattern was reported by Jager et al. [12]. ...
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... By performing DFT calculations and employing the Tauc method [28,29], the band gap nature was investigated, focusing on the Highest Occupied Molecular Orbital (HOMO) and Lowest Unoccupied Molecular Orbital (LUMO). By carefully examining the alignment of the valence band (VB) and conduction band (CB) energies in momentum space and their coincidence at a specific point, a direct band gap can be identified; conversely, different energy locations in momentum space signify an indirect band gap. ...
... Here, −ℎ ( ) = band to band absorption co-efficient, Si). Our simulation takes the following literature references for ZnSe [40], Si [41] and AlSb [42][43]. The physical parameters have been optimized in such a way that the values can be adopted in commercial scenarios. ...
... Defect densities in the order of 10 11 cm -2 have been considered at the n + -ZnSe/p-Si junction and in the order of 10 10 cm -2 at the p-Si/p + -AlSb interface. The optical absorption values for n + -ZnSe, p-Si and p + -AlSb have been obtained from the following literature sources [40], [41] and [42][43], respectively. The ability to preserve a high built-in potential in the chosen structure of n + -p-p + causes maintaining VOC above 1 V over a long range for the variation in thickness, doping concentration or impurity concentration [29][30]. ...
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... Recent advancements have made the software adaptable to simulate both crystalline (Si and GaAs families) and amorphous solar cells (a-Si and micromorphous Si). Our simulation takes following literature references for ZnSe [40], Si [41] and AlSb [42][43]. The physical parameters have been optimized in such a way that the values can be adopted in commercial scenarios. ...
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... It is noteworthy that the performance of WSe 2 device with ZnO ETL is slightly improved. Compared with the device using CdS ETL, its PCE has increased by only about 8.6 % (the actual PCE is 22.68 %, which is within close range of the previously reported results [43,50]). The results are very promising, but due to carrier recombination, improper band structure, incomplete absorption, low carrier collection efficiency, etc., there are still losses, so it is very likely to further enrich the device's performance. ...
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... For example, the bandgap of WSe 2 is between 1.16 and 1.54 eV, which is similar to the indirect bandgap of visible light absorption. 27 WSe 2 has a higher shear modulus and higher hardness under pressure. 27 WSe 2 is prone to shear under high pressure and, therefore, can be used as a solid lubricant. ...
... 27 WSe 2 has a higher shear modulus and higher hardness under pressure. 27 WSe 2 is prone to shear under high pressure and, therefore, can be used as a solid lubricant. 28 In addition, WSe 2 is considered as a prototype for electrochemical solar cells. ...
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... The solar cells were illuminated by the AM 1.5G Table 1, for Si and GaAs, respectively. The optical absorption coefficient data of each semiconductor used in the simulations were taken from the following literature references for ZnSe [34], Si [35], GaAs [36], AlSb [37,38] GaSb [39] and AlAs [40]. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 A c c e p t e d M a n u s c r i p t 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 ...
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... The channel length obtained from the source-drain separation is about 10 μm, and the channel width is 10-15 μm ( figure 1(a)). The carrier density of thin film WSe 2 is reported as ≈ 10 17 cm −3 [20] A droplet of ionic liquid (diethylmethyl(2-methoxyethyl)ammonium bis (trifluoromethylsulfonyl)imide; Aldrich) was placed on the WSe 2 flakes using a syringe. A platinum (Pt) coated tip probed the ionic liquid to apply the V g , as Pt electrodes are known to be very stable and inert in electrochemical systems [21]. ...
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We present the electrical characteristics of ionic liquid-gated ambipolar WSe2 field-effect transistors (FET) and analyze them graphically using a transport map. With the transport map, the ambipolar I–V characteristics, which have either electrons or holes as the majority charge carriers depending on the bias conditions, were easily divided into the electron and hole conduction regimes. The effect of the drain bias (Vd) on trapped charges is inferred from the decreased offset voltage, which indicates the downward deflection of the channel energy band with the Vd. We confirmed the change of the majority carrier types shown in the transport map by analyzing the output curves, which show a transition from rectifying to saturated behavior. The existence of a relatively thin Schottky barrier for hole conduction is supported by the degradation in the transconductance curves and the variation in Vth with the Vd. These results provide important information for understanding the operating mechanism of ambipolar WSe2 FETs gated by ionic liquids and can be extended to FETs based on other two-dimensional semiconducting materials.