Fig 2 - uploaded by Archana Bora
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Line profile of the intensity data of concentric fringes (i) without noise, (ii) with Poisson noise.
Source publication
In this paper, we introduce a novel artificial neural network (ANN) based scheme to estimate the thickness of thin films deposited on a given substrate. Here we consider the visible interference pattern between a plane wave and a diverging wave reflected from the thin film surface that records the thickness information of the thin film. We assume a...
