- A Complementary Topographic Feature Detection Algorithm Based on Surface Curvature for Three-Dimensional Level-Set Functions

Distribution of the calculated absolute mean curvature values of the two material layers of a stacked nanosheet FET shown in Fig. 4

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Reference

A Complementary Topographic Feature Detection Algorithm Based on Surface Curvature for Three-Dimensional Level-Set Functions - Scientific Figure on ResearchGate. Available from: https://www.researchgate.net/figure/Distribution-of-the-calculated-absolute-mean-curvature-values-of-the-two-material-layers_fig5_368361807 [accessed 27 Mar 2025]

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Distribution of the calculated absolute mean curvature values of the two material layers of a stacked nanosheet FET shown in Fig. 4

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<a href="https://www.researchgate.net/figure/Distribution-of-the-calculated-absolute-mean-curvature-values-of-the-two-material-layers_fig5_368361807"><img src="https://www.researchgate.net/publication/368361807/figure/fig5/AS:11431281121880293@1677121280497/Distribution-of-the-calculated-absolute-mean-curvature-values-of-the-two-material-layers.png" alt="Distribution of the calculated absolute mean curvature values of the two material layers of a stacked nanosheet FET shown in Fig. 4"/></a>