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Distribution of the calculated absolute mean curvature values of the two material layers of a stacked nanosheet FET shown in Fig. 4

Distribution of the calculated absolute mean curvature values of the two material layers of a stacked nanosheet FET shown in Fig. 4

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The level-set method is widely used in expanding front simulations in numerous fields of computational research, such as computer graphics, physics, or microelectronics. In the latter, the level-set method is employed for topography simulations of semiconductor device fabrication processes, being driven by complicated physical and chemical models....