Figure - available from: Microwave and Optical Technology Letters
This content is subject to copyright. Terms and conditions apply.
(A) Overall temperature distribution of AlN substrate. (B) Overall temperature distribution of quartz substrate.
Source publication
This paper proposed an accurate series resistance model tailored for Schottky diode‐based terahertz multipliers. Compared to the conventional electrothermal model (E‐T model) only considering thermal effects, this model comprehensively accounts for both thermal and frequency effects of the series resistor components, including the temperature‐depen...
Similar publications
In order to study the thermal deformation behavior of uranium-50wt.%zirconium, used Gleeble 3800 thermal simulation testing machine to carry out compression deformation experiments at different temperatures for this material. The effects of deformation temperature and strain rate on the alloy were studied. The results show that the peak stress of U...
