-
D. McMorrow,
S. Buchner,
M. Baze,
B. Bartholet,
R. Katz,
M. O'Bryan,
C. Poivey,
K.A. LaBel,
R. Ladbury, M. Maher,
F.W. Sexton
[show abstract]
[hide abstract]
ABSTRACT: The application of the pulsed laser approach for identifying latch-up sensitive regions in CMOS circuitry is described. The utility of this approach for preliminary latchup screening of both COTS and space-qualified parts for applications in radiation environments is described. An application of hardening-by-design principles in which a space-qualified CMOS product is modified, based on the pulsed laser results, to be latchup immune, is presented in detail. The design modifications are described
IEEE Transactions on Nuclear Science 09/2006; · 1.45 Impact Factor
-
D. McMorrow,
S. Buchner,
M. Baze,
B. Bartholet,
R. Katz,
M. O'Bryan,
C. Poivey,
K.A. Label,
R. Ladbury, M. Maher,
F. Sexton
[show abstract]
[hide abstract]
ABSTRACT: This paper describes application of the pulsed laser approach for identifying latch-up sensitive regions in CMOS circuitry. The utility of this approach for preliminary latchup screening of both COTS and space-qualified parts for applications in radiation environments is described. An application of hardening-by-design principles in which a space qualified CMOS product is modified, based on the pulsed laser results, to be latchup immune is presented in detail. The design modifications are described.
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on; 10/2005
-
[show abstract]
[hide abstract]
ABSTRACT: The first demonstration of through-wafer two-photon absorption (TPA) single-event effects (SEEs) testing is presented. We interrogate the single-event transient (SET) response of several different nodes of the LM124 operational amplifier via TPA carrier injection through both the front and back (substrate) chip surfaces. The results reveal that the SETs and sensitivities produced in several different nodes by front-side and back-side irradiation are effectively identical, confirming the validity of this approach for SEE studies.
IEEE Transactions on Nuclear Science 01/2005; · 1.45 Impact Factor
-
[show abstract]
[hide abstract]
ABSTRACT: The characteristics of single-event transients (SETs) generated in an LM119 voltage comparator with a pulsed laser have been studied under a wide variety of operating conditions. Those transients can be compared with transients obtained from circuit simulator programs to validate the model parameters used by those programs.
IEEE Transactions on Nuclear Science 07/2002; · 1.45 Impact Factor
-
[show abstract]
[hide abstract]
ABSTRACT: The characteristics of single-event transients generated in a LM119 voltage comparator with a pulsed laser have been studied under a wide variety of operating conditions. Those transients can be compared with transients obtained from circuit simulator programs to validate the model parameters used by those programs.
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on; 10/2001
