[show abstract]
[hide abstract]
ABSTRACT: The method of circular dichroism in X-ray resonant magnetic scattering is presented which allows a straightforward determination of the magnetization profile of magnetic patterns in ultrathin films. Application to single crystalline FePd layers shows unambiguously the presence of magnetic flux closure domains whose thickness can constitute a significant fraction ( approximately 25%) of the total film.
Journal of Synchrotron Radiation 06/2000; 7(Pt 3):178-81. · 2.73 Impact Factor