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Publications (1)0.59 Total impact

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    ABSTRACT: This paper shows a method to characterize microwave circuits using a near-field scanning microscope. Applied on various samples, it shows good resolution and weak disturbance for ICs operating with very common microwave components. Here, it is applied in an industrial surrounding to characterize the Bluetooth CMOS power amplifier. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 41: 209–213, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20096
    Microwave and Optical Technology Letters 05/2004; 41(3):209 - 213. DOI:10.1002/mop.20096 · 0.59 Impact Factor