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ABSTRACT: Ag/[BN/CoPt]5/Ag and [BN/Ag/CoPt]5/Ag thin films were deposited on glass substrates by magnetron sputtering and then annealed in vacuum at 600°C for 30 min.
The structures and magnetic properties of CoPt/BN multilayer films were investigated as a function of Ag layer thickness.
It was found that the face-centered tetragonal (fct) (001) texture of CoPt was improved greatly by introducing the Ag toplayer
or sublayer together with an Ag underlayer. Good (001)-oriented growth, low intergrain interactions as well as high perpendicular
anisotropy can be obtained in the Ag(3 nm)/[BN(2.5 nm)/CoPt(3 nm)]5/Ag(7 nm) and [BN(2.5 nm)/Ag(2 nm)/CoPt(3 nm)]5/Ag(10 nm) films, which become potential candidates for ultrahigh density magnetic
Keywordsmagnetic thin films–multilayers–magnetic recording–magnetron sputtering–silver–microstructure–magnetic properties
Rare Metals 04/2011; 30(2):137-141. DOI:10.1007/s12598-011-0212-x · 1.01 Impact Factor