R.L.T. Wolde
San Diego State University, San Diego, CA, USA

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Publications (2)0 Total impact

  • Conference Proceeding: Diffuse electrical injury-a study of 136 subjects
    M.S. Morse, J.S. Berg, R.L.T. Wolde
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    ABSTRACT: Some electrical injuries defy explanation by the theories of thermal damage or electroporation. In rare electrical contacts, symptomatology arises that is remote to the theoretical current pathway and is often disproportionate to the parameters of electrical contact. The rarity with which this type of diffuse electrical injury (DEI) occurs often leads to diagnoses that the symptoms are of a nonorganic nature. An on-going Web-based interactive survey is being used to locate and query individuals suffering from rarely occurring responses to electrical contact. The research results indicate that there is a symptomatology fingerprint associated with the class of electrical shock injury studied.
    Engineering in Medicine and Biology Society, 2003. Proceedings of the 25th Annual International Conference of the IEEE; 10/2003
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    Conference Proceeding: Analysis of current density in the carpal tunnel region during an electrical accident by way of the finite element method
    M.S. Morse, J.S. Berg, R.L.T. Wolde
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    ABSTRACT: Carpal tunnel syndrome (CTS) has been diagnosed in as many as 10% of the hand-involved electrical contacts studied by the authors. Typically a CTS diagnosis is indicative of median nerve compression. Such would not be consistent with the known apparatus of electrical injury. Using the finite element method, current density has been evaluated in the carpal tunnel region during an electrical contact. The results indicate that while the majority of current does not transverse the nerve tissue, the current density is significantly elevated in the nerves as they traverse the carpal tunnel region. In certain circumstances, the localized current elevation could cause nerve damage which would masquerade as CTS when diagnostically tested.
    Engineering in Medicine and Biology Society, 2003. Proceedings of the 25th Annual International Conference of the IEEE; 10/2003

Institutions

  • 2003
    • San Diego State University
      • Department of Electrical and Computer Engineering
      San Diego, CA, USA
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