Takayuki Shiraishi

Yokohama National University, Yokohama-shi, Kanagawa-ken, Japan

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Publications (8)1.07 Total impact

  • Takayuki Shiraishi, Hiroshi Fujimoto
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    ABSTRACT: This paper discusses novel high-speed imaging method for atomic force microscope (AFM) without modification of hardware. In conventional AFM, an image is obtained from control input of Z-scanner. On the other hand, we propose observer based imaging method which has based on observer theory in control technology. The proposed method achieves high-speed imaging without loss of stability margin of control system, and modification of hardware. In this paper, effectiveness of proposed method is shown by some simulation and experimental results.
    Japanese Journal of Applied Physics 02/2012; 51(2):6602-. · 1.07 Impact Factor
  • Takayuki Shiraishi, Hiroshi Fujimoto
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    ABSTRACT: The purpose of this paper is development of high-precision trajectory tracking control for nonminimum-phase continuous-time systems with unstable zeros. This paper proposes a two degree of freedom control system design method that is based on a novel factorization method for nonminimum-phase continuous-time systems. First, nonminimum-phase continuous-time systems is factorized to minimum-phase system and zero-phase system in continuous-time domain. The feedforward controller is constructed from inverse system of each factorized system. The inverse system of the minimum-phase system is designed by multi-rate perfect model following control theory, and the inverse system of zero-phase system is designed by zero-phase FIR filter. Finally, This paper shows the effectiveness of proposed method by simulation and experimental results.
    01/2012;
  • T. Shiraishi, H. Fujimoto
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    ABSTRACT: The purpose of this paper is implementation of fast imaging of AFM. In general AFM, the image is obtained from the control input of the Z-scanner. In this case, Fast imaging is prevented by the resonance peak of the plant. In authors' research group, the surface topography observer which is the surface topography estimating method based on the observer theory has been proposed. In this paper, the dynamic model used by authors' research group is improved, and the more detailed model is proposed. Therefore, the surface topography observer still faster than the conventional surface topography observer is proposed. Simulation and an experimental result show the effectiveness of the proposed method.
    American Control Conference (ACC), 2010; 08/2010
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    Takayuki Shiraishi, Hiroshi Fujimoto
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    ABSTRACT: Recently, in high precision positioning field, the improvement of the positioning accuracy is required for the development of the next generation technology like nano-technology. In many industry application machines, we can often see the repetitive operation [?]. For the repetitive position command of the positioning machine, the investigation for the suppression of the repetitive tracking error using iterative learn-ing control (ILC) is increasing. For above reasons, the purpose of this paper is improvement of the positioning accuracy in the high-speed repetitive position command. The plant is the Piezo-scanner of the atomic force microscope which is not only used for measurement device but nano-manipulation. the requirement of positioning accuracy of the AFM is nano-scale. In ILC, the inverse system of the plant is often used as the learning filter. This design of the learning filter using the inverse system is most important part in ILC system design. Thus, there are many methods of the inverse system design. In this paper, the ILC using the perfect inverse system of the plant which based on the perfect tracking control is proposed. Its proposed inverse system of the plant is the perfect inverse system of the plant, and the all poles of the proposed inverse system of the plant can be located on the origin in discrete-time domain. Thus, the proposed inverse plant has good characteristics for ILC system. In this paper, the effectiveness of the proposed method is shown by the some simulations and experimental results.
    01/2010;
  • T. Shiraishi, H. Fujimoto
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    ABSTRACT: This paper addresses the development of amplitude modulation atomic force microscopes (AM-AFM). The output of the AM-AFM is obtained from amplitude demodulation of the excited cantilever tip position. Thus, when the amplitude of the cantilever tip position is zero or maximum value, the output will be saturated. The output saturation prevents disturbance suppression. In this paper, the anti-saturation surface topography observer which improves the output saturation is proposed. The proposed method estimates the unsaturated output and uses it for the feedback loop. Finally, effectiveness of a proposed method is shown by simulation and experimental results.
    ICCAS-SICE, 2009; 09/2009
  • Source
    T. Shiraishi, H. Fujimoto
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    ABSTRACT: Purpose of this paper is realization of high-speed measurement atomic force microscope (AFM) from view point of the control technology without modification of the hardware. Almost commercial AFM, 3D-image is obtained from control input. High-speed imaging is possible if we can design feedback controller which achieves the high-bandwidth servo design. However, we know that it is restricted by bode integral theorem as resonance peak of the plant. For high-speed imaging, our research group proposed surface topography observer which based on the disturbance observer theory. we can locate the pole of the observer without considering of the resonance of the plant. Thus, we succeeded in high-speed imaging by our proposed observer. On the other hand, as the scanning speed of the X scanner becomes faster, the tracking error increases, because the feedback characteristic is same as conventional system. Not only the high-speed imaging but the suppression of the tracking error is important, because the tracking error express the contact force to the sample. Our research group proposed the tracking error suppression methods which are feedforward compensation. This paper describes the dual-directional type surface topography learning observer. This paper shows our proposed methods which are effective for the high-speed AFM by simulation and experimental results.
    American Control Conference, 2009. ACC '09.; 07/2009
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    T. Shiraishi, H. Fujimoto
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    ABSTRACT: This paper addresses an amplitude modulation dynamic mode atomic force microscope (AM-AFM). AFM is an equipment which can measure nanoscale surface topography of the given sample. It is also known that measurement time is very long. Therefore, high-speed measurement is required in many industrial applications. In general AFMs, most common approach is only classical feedback control. This paper proposes two feedforward compensation methods by surface topography learning observer based on surface topography observer. These proposed methods archive high-speed measurement in simulation and experimental results.
    SICE Annual Conference, 2008; 09/2008
  • Takayuki Shiraishi, Hiroshi Fujimoto

Publication Stats

5 Citations
1.07 Total Impact Points

Institutions

  • 2008–2010
    • Yokohama National University
      • Department of Physics, Electrical and Computer Engineering
      Yokohama-shi, Kanagawa-ken, Japan