J.-M. Lauenstein

Publications (4)1.45 Total impact

• Conference Proceeding: Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

  M.V. O'Bryan, K.A. LaBel, J.A. Pellish, J.-M. Lauenstein, Dakai Chen, C.J. Marshall, T.R. Oldham, H.S. Kim, A.M. Phan, M.D. Berg, M.J. Campola, A.B. Sanders, P.W. Marshall, M.A. Xapsos, D.F. Heidel, K.P. Rodbell, J.W. Swonger, D. Alexander, M. Gauthier, B. Gauthier
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  ABSTRACT: We present the results of single event effects (SEE) testing and investigating the effects of space radiation on electronics. This paper is a summary of test results.
  Radiation Effects Data Workshop (REDW), 2011 IEEE; 08/2011
• Article: Interpreting Space-Mission LET Requirements for SEGR in Power MOSFETs

  J.-M. Lauenstein, R.L. Ladbury, N. Goldsman, H.S. Kim, D.A. Batchelor, A.M. Phan
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  ABSTRACT: A TCAD simulation-based method is developed to evaluate whether derating of high-energy heavy-ion accelerator test data bounds the risk for single-event gate rupture (SEGR) from much higher energy on-orbit ions for a mission linear energy transfer (LET) requirement. It is shown that a typical derating factor of 0.75 applied to a single-event effect (SEE) response curve defined by high-energy accelerator SEGR test data provides reasonable on-orbit hardness assurance, although in a high-voltage power MOSFET, it did not bound the risk of failure.
  IEEE Transactions on Nuclear Science 01/2011; · 1.45 Impact Factor
• Conference Proceeding: Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

  M.V. O'Bryan, K.A. LaBel, J.A. Pellish, Dakai Chen, J.-M. Lauenstein, C.J. Marshall, R.L. Ladbury, T.R. Oldham, H.S. Kim, A.M. Phan, [......], F. Irom, L.G. Pearce, E.T. Thomson, T.M. Bernard, H.W. Satterfield, A.P. Williams, N.W. van Vonno, J.F. Salzman, S. Burns, R.S. Albarian
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  ABSTRACT: We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
  Radiation Effects Data Workshop (REDW), 2010 IEEE; 08/2010
• Conference Proceeding: Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

  M.V. O'Bryan, K.A. LaBel, J.A. Pellish, S.P. Buchner, R.L. Ladbury, T.R. Oldham, H.S. Kim, M.J. Campola, J.-M. Lauenstein, D. Chen, M.D. Berg, A.B. Sanders, P.W. Marshall, C.J. Marshall, M.A. Xapsos, K. Kruckmeyer, M. Leftwich, J.M. Benedetto
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  ABSTRACT: We present the results of single event effects testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
  Radiation Effects Data Workshop, 2009 IEEE; 08/2009