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ABSTRACT: An undulator‐radiation‐excited x‐ray fluorescence analysis system for light elements has been developed and tested on the 26‐period multipole wiggler/undulator beamline at the Photon Factory. An entrance‐slitless optics with a variable‐spacing grating was devised for a fluorescent x‐ray dispersion system to achieve spectroscopic analysis with high efficiency and high resolution. Both soft x‐ray emission (SXE) spectra and x‐ray absorption near‐edge structure (XANES) spectra with fluorescent x‐ray detection were obtained by this system, taking advantage of the high brightness and quasimonochromatic character of the incident undulator beam. The analysis system was evaluated by measuring the B K α SXE and fluorescence XANES spectra of B, BN, and B 2 O 3 .
Review of Scientific Instruments 01/1993; · 1.37 Impact Factor
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ABSTRACT: Performance of a 2‐m grazing incidence vacuum ultraviolet (VUV)/soft x‐ray monochromator was evaluated with silicon‐carbide‐based master grating of 1200 lines/mm groove density that was newly developed for use of undulator radiation. Incident power density on the grating surface was as high as 120 mW/mm<sup>2</sup>. Surface observation of the grating after the test operation showed that the periodic structure and reflective surface of the grooves were well preserved, except for slight degradation of the groove edges, even though no active cooling system was equipped. Photon flux was of the order of 10<sup>1</sup><sup>2</sup> photons/s. Efficiency of second‐order diffraction relative to the first‐order diffraction was 20%–50%. Resolving power of 2200 was achieved at 244.4 eV for 5‐μm exit slit width.
Review of Scientific Instruments 02/1992; · 1.37 Impact Factor
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ABSTRACT: SiC‐based mechanically ruled master gratings and replicas are developed for synchrotron radiation instruments. An SiC‐based gold replica grating without any thermal deformation due to active cooling is used in a high‐photon‐flux‐soft x‐ray monochromator that is installed in a bending magnet beamline. An SiC‐based gold master grating is used in a vacuum ultraviolet/soft x‐ray monochromator installed in an undulator beamline with slight groove shape deformation. This deformation is caused by the thermal change of the gold film occurring at higher than 250–300 °C. A method for cleaning carbon‐contaminated synchrotron radiation optics is tested. The ultraviolet ozone ashing method effectively cleans carbon contamination on the optics and is useful for extending the lifetime of synchrotron radiation optics.
Review of Scientific Instruments 02/1992; · 1.37 Impact Factor
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ABSTRACT: Spectral characterization was made on undulator radiation from a 26‐period high‐field permanent magnet multipole wiggler/undulator at the 2.5‐GeV Photon Factory storage ring. In an undulator mode of a weaker field version of the insertion device, the K parameter was tuned up to 5.8. Absolute spectral measurement showed source brightness of the first harmonic peak in the order of 10<sup>15</sup> photons/s mrad<sup>2</sup> 100 mA 0.1% bandwidth over the full tunable range of the first peak from 40 to 400 eV. As for the higher harmonics, spectral profile, the peak brightness, and quasimonochromaticity were obtained in this transition region where the K parameter increased beyond unity.
Review of Scientific Instruments 08/1989; · 1.37 Impact Factor
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ABSTRACT: A VUV/soft x‐ray monochromator was developed for utilizing undulator radiation from a 26‐period multipole wiggler/undulator at the Photon Factory. An entrance slitless quasi‐Rowland circle mounting was adopted to the monochromator optics, aimed at achieving the compatibility of high resolution with high‐output flux. The optics was realized by a decoupling of horizontal focusing with a deflection mirror from vertical focusing with an aberration‐free vertical dispersion system which was composed of a cylindrical mirror and a concave grating. The optics and mechanism of the monochromator as well as its test operation made after installation are described.
Review of Scientific Instruments 08/1989; · 1.37 Impact Factor
