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Publications (2)2.73 Total impact

  • Article: ESCA microscopy beamline at ELETTRA
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    ABSTRACT: The article describes the ESCA microscopy beamline dedicated to high spatial resolution quantitative and qualitative analysis on surfaces and interfaces. The scanning microscope is constructed to work both in transmission and photoemission within the photon energy range from 200 to 1200 eV with a spatial resolution of ∼0.1 μm. A Fresnel zone plate demagnifies the photon beam to submicrometer dimensions with 10<sup>9</sup>–10<sup>10</sup> photons/s in the focus spot. A photodiode and a hemispherical electron energy analyzer are used as detectors for recording the transmitted x‐rays and emitted photoelectrons, respectively. The operation modes in photoemission give the opportunity to obtain conventional energy distribution curve spectra from a microspot or a two‐dimensional micrograph of the spatial distribution and local concentration of a selected element as the sample is mechanically scanned. For conductive specimen topography measurements of a selected surface area probed by SPEM are possible using a scanning tunnelling microscope. The first test images of a zone plate and an e‐beam written specimen with 1 μm<sup>2</sup> Au squares on Si have shown a spatial resolution better than 0.2 μm. © 1995 American Institute of Physics.
    Review of Scientific Instruments 11/1995; · 1.37 Impact Factor
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    Article: Super ESCA: First beamline operating at ELETTRA
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    ABSTRACT: The Super‐ESCA beamline has been designed for high resolution core level spectroscopy of adsorbates on single crystal surfaces using soft x‐ray synchrotron radiation. It receives the light from an 81 period undulator with 5.6 cm period and 4.5 m length in the storage ring ELETTRA. The tunability of this insertion device, at a storage ring electron energy of 2.0 GeV and the connected modified SX700 monochromator allows the performance of experiments at this beamline in the photon energy range 100–2000 eV. This beamline is now operational and first absorption spectra are presented which show available resolving powers varying from 8000 to 3000 for photon energies between 240 and 850 eV. © 1995 American Institute of Physics.
    Review of Scientific Instruments 03/1995; · 1.37 Impact Factor