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ABSTRACT: Charge sharing in a dual-interlocked storage cell (DICE) Flip-Flop (FF) manufactured in 65 nm CMOS Bulk is analyzed using a new proprietary Monte-Carlo tool suite named TIARA (Tool suIte for rAdiation Reliability Assessment). Monte-Carlo simulations show the simultaneous charge collection by transistors in the same well is 5 X more important than charge sharing in different wells. Additionally, TIARA simulations are used to identify layout weaknesses. Subsequent layout modifications have increased the threshold LET by 50%.
IEEE Transactions on Nuclear Science 01/2011; · 1.45 Impact Factor
