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Publications (4)1.73 Total impact

  • Article: 3C-SiC growth on 6H-SiC substrates
    Materials Science Forum 01/2002;
  • Article: 3C-SiC growth on 6H-SiC substrates
    Materials Science Forum 01/2002;
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    Article: Crystal growth of 3C-SiC polytype on 6H-SiC substrate
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    ABSTRACT: 3C–SiC epitaxial crystalgrowth was carried out by repeated cycles of Si MBE deposition at room temperature followed by a carbonization under C2H4 and annealing at 900°C. This was done on a 3×3 reconstructed, well oriented, Si terminated 6H–SiC face. The surface was chemically and crystallographically controlled in situ by photoemission and LEED both during the cleaning procedure and within any growth sequence. By X-ray photoelectron diffraction and by transmission electron microscopy and diffraction, the 16 nm formed epilayer was characterized as a single 3C–SiC phase. A significant part of the cross-section image exhibits moiré fringes whose periodicity (7.5 Å) is three time the d1 1 1 reticular distance of the 3C–SiC monocrystal. This is attributed to the superimposition of {1 1 1} twinned domains, a consequence of two equiprobable orientation possibilities for 3Cgrowth onto the hexagonal substrate. The formations of the 15R or the hypothetical 9R polytypes could be ruled out thanks to the electron diffraction patterns.
    Journal of Crystal Growth 01/2002; · 1.73 Impact Factor
  • Article: Crystal growth of 3C–SiC polytype on 6H–SiC(0001) substrate
    [show abstract] [hide abstract]
    ABSTRACT: 3C–SiC epitaxial crystal growth was carried out by repeated cycles of Si MBE deposition at room temperature followed by a carbonization under C2H4 and annealing at 900°C. This was done on a 3×3 reconstructed, well oriented, Si terminated 6H–SiC face. The surface was chemically and crystallographically controlled in situ by photoemission and LEED both during the cleaning procedure and within any growth sequence. By X-ray photoelectron diffraction and by transmission electron microscopy and diffraction, the 16 nm formed epilayer was characterized as a single 3C–SiC phase. A significant part of the cross-section image exhibits moiré fringes whose periodicity (7.5 Å) is three time the d1 1 1 reticular distance of the 3C–SiC monocrystal. This is attributed to the superimposition of {1 1 1} twinned domains, a consequence of two equiprobable orientation possibilities for 3C growth onto the hexagonal substrate. The formations of the 15R or the hypothetical 9R polytypes could be ruled out thanks to the electron diffraction patterns.
    Journal of Crystal Growth.