Nicole Hall

York University, Toronto, Ontario, Canada

Are you Nicole Hall?

Claim your profile

Publications (2)5.32 Total impact

  • [Show abstract] [Hide abstract]
    ABSTRACT: Poly(ɛ-caprolactone)-b-polystyrene with vacant bipyridine coordinating sites and metallated AB type diblock with well-defined metal loci in the polymer chain were synthesized and characterized. Solution atom transfer radical polymerization (ATRP) of styrene where a poly(ɛ-caprolactone) macromonomer acted as initiator and derivative complex of [Ru(p-cymene)Cl2]2 as catalyst is reported. ATRP reaction conditions with respect to polymer molecular weights and polydispersity indices (PDI) of the target bifunctional polymers were examined. Electronic absorption and emission spectra of the resultant functional polymers provided evidence of the ruthenium metal chromophores in the diblock copolymer. The thermal properties of all polymers were investigated by differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA), and indicated that they possess a high thermal stability and are miscible in the molten state. The semicrystalline nature of the PCL macroligand and the morphology of thin films of the metal free diblocks were also elucidated by combination of atomic force microscopy (AFM), scanning electron microscopy (SEM) and wide angle X-ray diffraction (WAXD) studies.
    Polymer 05/2006; 47(12-47):4282-4291. DOI:10.1016/j.polymer.2006.03.037 · 3.56 Impact Factor
  • T. Jiang · N. Hall · A. Ho · S. Morin ·
    [Show abstract] [Hide abstract]
    ABSTRACT: This study of the electrodeposition of tin on steel substrates demonstrates that it is possible to obtain quantitative information on the thin film growth at industrially relevant substrates using atomic force microscopy (AFM) to monitor the film morphology and X-ray fluorescence (XRF) to measure the average film thickness. The effects of current density and electrolyte temperature on the film morphology, surface roughness, and grain size distribution (GSD) are reported. While the roughness of the substrates used in this study can vary by several hundred nanometers to a micrometer, we are interested in quantitative characterization of the tin films with thickness varying from a few tens of nanometers to several hundred nanometers. This study shows that for the range of film thickness and length scale studied, analysis of the AFM images can provide quantitative characterization of the thin film roughness and grain size distribution at various stages of growth with little interference from the substrate morphological inhomogeneities.
    Thin Solid Films 01/2005; 471(1):76-85. DOI:10.1016/j.tsf.2004.04.051 · 1.76 Impact Factor