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ABSTRACT: Y1Ba2Cu3Ox films, ranging in thickness from 0.9 to 10 μm, were grown on MgO(100) substrates by liquid phase epitaxy. These films were characterized structurally and electrically. From θ−2σ and ƒ scan X-ray diffraction, and Rutherford backscattering spectrometry measurements, it was found that the films were c-axis oriented and had good in-plane alignment, showing that good epitaxial growth was achieved. The Tc,end values in a 20 mm long and 15 mm wide Y1Ba2Cu3Ox film exceeded 90 K. The Tc and resistivity values did not become degraded after patterning into a strip. Although Jc values decreased with increasing film thickness, even a 7 μm-thick film showed a Jc value of 9.3 × 105 A/cm2 at 77 K. These data are comparable to those reported for Y1Ba2Cu3Ox films prepared on CeO2/YSZ(100) by pulse laser deposition, and thought to be due to the c-axis orientation and good in-plane alignment of the liquid phase epitaxially grown thick films.
Physica C: Superconductivity.
