Publications (4)0 Total impact
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Article: A Floorprint-Based Defect Tolerance for Nano-Scale Application-Specific IC.
IEEE T. Instrumentation and Measurement. 01/2009; 58:1283-1290. -
Conference Proceeding: Modeling and Evaluation of Threshold Defect Tolerance.
23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA; 01/2008 -
Conference Proceeding: Efficient and Robust Delay-Insensitive QCA (Quantum-Dot Cellular Automata) Design.
21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA; 01/2006 -
Conference Proceeding: QCA-Based Majority Gate Design under Radius of Effect-Induced Faults.
20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA; 01/2005