Angelo Marcello Anile

Publications (5)0.3 Total impact

• Source

  Available from: di.unito.it

  Conference Proceeding: Possibilistic Worst Case Distance and Applications to Circuit Sizing.

  Eva Sciacca, Salvatore Spinella, Angelo Marcello Anile
  Theoretical Advances and Applications of Fuzzy Logic and Soft Computing, Selection of Papers from IFSA 2007; 01/2007
• Conference Proceeding: Lipschitzian Pattern Search and Immunological Algorithm with Quasi-Newton Method for the Protein Folding Problem: An Innovative Multistage Approach.

  Angelo Marcello Anile, Vincenzo Cutello, Giuseppe Narzisi, Giuseppe Nicosia, Salvatore Spinella
  Neural Nets, 16th Italian Workshop on Neural Nets, WIRN 2005, and International Workshop on Natural and Artificial Immune Systems, NAIS 2005, Vietri sul Mare, Italy, June 8-11, 2005, Revised Selected Papers; 01/2005
• Conference Proceeding: Comparison among evolutionary algorithms and classical optimization methods for circuit design problems.

  Angelo Marcello Anile, Vincenzo Cutello, Giuseppe Nicosia, Rosario Rascunà, Salvatore Spinella
  Proceedings of the IEEE Congress on Evolutionary Computation, CEC 2005, 2-4 September 2005, Edinburgh, UK; 01/2005
• Article: Modeling Uncertain Sparse Data with Fuzzy B-splines.

  Angelo Marcello Anile, Salvatore Spinella
  Reliable Computing. 01/2004; 10:335-355.
• Article: Stochastic response surface method and tolerance analysis in microelectronics

  Angelo Marcello Anile, Salvatore Spinella, Salvatore Rinaudo
  [show abstract] [hide abstract]
  ABSTRACT: Tolerance analysis is a very important tool for chip design in the microelectronics industry. The usual method for tolerance analysis is Monte Carlo simulation, which, however, is extremely CPU intensive, because in order to yield statistically significant results, it needs to generate a large sample of function values. Here we report on another method, recently introduced in several fields, called stochastic response surface method, which might be a viable alternative to Monte Carlo simulation for some classes of problems. The application considered here is on the tolerance analysis of the current of a submicrometer n+-n-n+ diode as a function of the channel length and the channel doping. The numerical simulator for calculating the current is based on the energy transport hydrodynamical model introduced by Stratton, which is one of the most widely used in this field.
  COMPEL International Journal of Computations and Mathematics in Electrical 05/2003; 22(2):314-327. · 0.30 Impact Factor