Alessandra Fudoli

Publications (2)0 Total impact

• Article: Understanding Yield Losses in Logic Circuits.

  Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew
  IEEE Design & Test of Computers. 01/2004; 21:208-215.
• Conference Proceeding: High Accuracy Stimulus Generation for A/D Converter BIST.

  Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello
  Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002; 01/2002