Hong Shin Jun

Publications (2)0 Total impact

• Conference Proceeding: At-Speed Interconnect Test and Diagnosis of External Memories on a System.

  Heon C. Kim, Hong Shin Jun, Xinli Gu, Sung Soo Chung
  Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA; 01/2004
• Conference Proceeding: Removing JTAG Bottlenecks in System Interconnect Test.

  Hong Shin Jun, Sung Soo Chung, Sang H. Baeg
  Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA; 01/2004