Wei-Hsiao Liu

Publications (2)0 Total impact

• Conference Proceeding: Very-Low-Voltage testing of amorphous silicon TFT circuits.

  Shiue-Tsung Shen, Wei-Hsiao Liu, Chien-Mo James Li, I-Chun Cheng
  2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009; 01/2009
• Conference Proceeding: Very-Low-Voltage Testing of Amorphous Silicon TFT Circuits.

  Shiue-Tsung Shen, Wei-Hsiao Liu, En-Hua Ma, James Chien-Mo Li, I-Chun Cheng
  Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan; 01/2009