Michail Maniatakos

Publications (8)0 Total impact

• Source

  Available from: mmaniatakos.com

  Article: Workload-Cognizant Concurrent Error Detection in the Scheduler of a Modern Microprocessor.

  Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Chandra Tirumurti, Yiorgos Makris
  IEEE Trans. Computers. 01/2011; 60:1274-1287.
• Source

  Available from: yale.edu

  Article: Instruction-Level Impact Analysis of Low-Level Faults in a Modern Microprocessor Controller.

  Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris
  IEEE Trans. Computers. 01/2011; 60:1260-1273.
• Conference Proceeding: Exponent monitoring for low-cost concurrent error detection in FPU control logic.

  Michail Maniatakos, Yiorgos Makris, Prabhakar Kudva, Bruce M. Fleischer
  29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA; 01/2011
• Conference Proceeding: AVF Analysis Acceleration via Hierarchical Fault Pruning.

  Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris
  16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway; 01/2011
• Conference Proceeding: Workload-driven selective hardening of control state elements in modern microprocessors.

  Michail Maniatakos, Yiorgos Makris
  28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA; 01/2010
• Source

  Available from: yale.edu

  Conference Proceeding: Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller.

  Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris
  27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA; 01/2009
• Conference Proceeding: On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors.

  Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Yiorgos Makris
  2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008; 01/2008
• Conference Proceeding: Design and Evaluation of a Timestamp-Based Concurrent Error Detection Method (CED) in a Modern Microprocessor Controller.

  Michail Maniatakos, Naghmeh Karimi, Yiorgos Makris, Abhijit Jas, Chandra Tirumurti
  23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA; 01/2008