[show abstract]
[hide abstract]
ABSTRACT: This paper describes a novel test and repair methodology for an embedded content-addressable memory (CAM) design. Exhaustive match-line testing is used to ensure correct search operation after manufacturing, while search margin testing is used to provide robust functionality for the life of the product. With CAM being one of the most power-hungry circuits on chip, it is also important to test the effects of CAM-induced power-supply noise. Programmable BIST patterns induce worst-case power-supply noise in the system and then test CAM sensitivity to it. Fails in the CAM are detected by BIST and repaired using row redundancy with word-line and match-line steering. Hardware results stress the importance of this test and repair methodology
Test Conference, 2006. ITC '06. IEEE International; 11/2006
