X. T. Ren

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Publications (1)0 Total impact

Article: Study of proton irradiation effects on AlGaN/GaN high electron mobility transistors.

Ling Lv, J. G. Ma, Y. R. Cao, J. C. Zhang, W. Zhang, L. Li, S. R. Xu, X. H. Ma, X. T. Ren, Y. Hao

Microelectronics Reliability. 01/2011; 51:2168-2172.

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Long Li (1)

China Agricultural University
Y. Hao (1)
W. Zhang (1)
Ling Lv (1)
J. G. Ma (1)
J. C. Zhang (1)
Y. R. Cao (1)
S. R. Xu (1)
X. H. Ma (1)

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