Steven Thijs

Publications (8)2.11 Total impact

• Source

  Available from: Mirko Scholz

  Article: Investigating ESD sensitivity in electrostatic SiGe MEMS

  Sandeep Sangameswaran, Jeroen De Coster, Dimitri Linten, Mirko Scholz, Steven Thijs, Guido Groeseneken, Ingrid De Wolf
  [show abstract] [hide abstract]
  ABSTRACT: The sensitivity of electrostatically actuated SiGe microelectromechanical systems to electrostatic discharge events has been investigated in this paper. Torsional micromirrors and RF microelectromechanical systems (MEMS) actuators have been used as two case studies to perform this study. On-wafer electrostatic discharge (ESD) measurement methods, such as the human body model (HBM) and machine model (MM), are discussed. The impact of HBM ESD zap tests on the functionality and behavior of MEMS is explained and the ESD failure levels of MEMS have been verified by failure analysis. It is demonstrated that electrostatic MEMS devices have a high sensitivity to ESD and that it is essential to protect them.
  Journal of Micromechanics and Microengineering 03/2010; 20(5):055005. · 2.11 Impact Factor
• Conference Proceeding: Verifying electrical/thermal/thermo-mechanical behavior of a 3D stack - Challenges and solutions.

  Geert Van der Plas, Steven Thijs, Dimitri Linten, Guruprasad Katti, Paresh Limaye, Abdelkarim Mercha, Michele Stucchi, Herman Oprins, Bart Vandevelde, Nikolaos Minas, Miro Cupac, Morin Dehan, Marc Nelis, Rahul Agarwal, Wim Dehaene, Youssef Travaly, Eric Beyne, Paul Marchal
  IEEE Custom Integrated Circuits Conference, CICC 2010, San Jose, California, USA, 19-22 September, 2010, Proceedings; 01/2010
• Conference Proceeding: Design issues and considerations for low-cost 3D TSV IC technology.

  Geert Van der Plas, Paresh Limaye, Abdelkarim Mercha, Herman Oprins, Cristina Torregiani, Steven Thijs, Dimitri Linten, Michele Stucchi, Guruprasad Katti, Dimitrios Velenis, [......], Ann Opdebeeck, Michal Rakowski, Bart De Wachter, Morin Dehan, Marc Nelis, Rahul Agarwal, Wim Dehaene, Youssef Travaly, Pol Marchal, Eric Beyne
  IEEE International Solid-State Circuits Conference, ISSCC 2010, Digest of Technical Papers, San Francisco, CA, USA, 7-11 February, 2010; 01/2010
• Article: ESD On-Wafer Characterization: Is TLP Still the Right Measurement Tool?

  Mirko Scholz, Dimitri Linten, Steven Thijs, Sandeep Sangameswaran, Masanori Sawada, Toshiyuki Nakaei, Takumi Hasebe, Guido Groeseneken
  IEEE T. Instrumentation and Measurement. 01/2009; 58:3418-3426.
• Article: A plug-and-play wideband RF circuit ESD protection methodology: T-diodes.

  Dimitri Linten, Steven Thijs, Jonathan Borremans, Morin Dehan, D. Trémouilles, Mirko Scholz, M. I. Natarajan, Piet Wambacq, Stefaan Decoutere, Guido Groeseneken
  [show abstract] [hide abstract]
  ABSTRACT: A novel “plug-and-play” ESD protection methodology for wideband RF applications is demonstrated. This methodology, referred to as T-diodes, utilizes an integrated transformer together with classical ESD protection diodes. The T-diodes act as an artificial transmission line that, when placed as a “plug-and-play” ESD protection component in front of an unprotected wideband LNA, preserves the input matching of that LNA. As a demonstrator, a wideband RF LNA in 0.18 μm CMOS is protected above 4.5 kV HBM ESD robustness without degrading its bandwidth.
  Microelectronics Reliability. 01/2009; 49:1440-1446.
• Article: Transient voltage overshoot in TLP testing - Real or artifact?

  D. Trémouilles, Steven Thijs, Philippe Roussel, M. I. Natarajan, Vesselin K. Vassilev, Guido Groeseneken
  Microelectronics Reliability. 01/2007; 47:1016-1024.
• Article: Implementation of plug-and-play ESD protection in 5.5GHz 90nm RF CMOS LNAs - Concepts, constraints and solutions.

  Steven Thijs, M. Natarajan Iyer, Dimitri Linten, Wutthinan Jeamsaksiri, T. Daenen, Robin Degraeve, Andries Scholten, Stefaan Decoutere, Guido Groeseneken
  Microelectronics Reliability. 01/2006; 46:702-712.
• Article: High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices.

  Vesselin K. Vassilev, S. Jenei, Guido Groeseneken, R. Venegas, Steven Thijs, V. De Heyn, M. Natarajan Iyer, Michiel Steyaert, H. E. Maes
  Microelectronics Reliability. 01/2003; 43:1011-1020.