M. C. Nicotra

Publications (1)0 Total impact

• Article: Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage.

  D. Corso, S. Aurite, E. Sciacca, D. Naso, Salvatore Lombardo, A. Santangelo, M. C. Nicotra, S. Cascino
  Microelectronics Reliability. 01/2007; 47:806-809.