Publications (2)0 Total impact
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Conference Proceeding: SEU tolerant SRAM cell.
Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011; 01/2011 -
Conference Proceeding: SEU tolerant SRAM for FPGA applications.
Proceedings of the International Conference on Field-Programmable Technology, FPT 2010, 8-10 December 2010, Tsinghua University, Beijing, China; 01/2010