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ABSTRACT: We succeeded in observing atomic scale images of undamaged single InAs quantum dots (QDs) embedded in a GaAs matrix using a combined use of high resolution transmission electron microscope (HRTEM) and focused ion beam (FIB) system for the first time. The QD can be viewed from multi directions, and a conclusive and comprehensive interpretation of the size and shape anisotropy has been achieved. Asymmetry of the structural properties has been confirmed between the [110] and [-110] crystallographic directions. The embedded QD is elongated along the [-110] axis. The strain-field pattern is also asymmetric according to the shape anisotropy Our results will enable the investigation of exact structural anisotropy and their influence on the atom like properties of QDs.
Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on; 06/2007
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Microscopy and Microanalysis - MICROSC MICROANAL. 01/2007; 13.
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Microscopy and Microanalysis - MICROSC MICROANAL. 01/2007; 13.
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Y Taniguchi ,
T Furutsu ,
M Otsuka ,
K Nakamura ,
T Hashimoto ,
M Konno , T Yaguchi ,
S Terada ,
K Kaji ,
M Koguchi ,
T Matsumoto
Microscopy and Microanalysis 07/2006; 12:1780 - 1781. · 3.01 Impact Factor
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Microscopy and Microanalysis 07/2006; 12:528 - 529. · 3.01 Impact Factor
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Microscopy and Microanalysis - MICROSC MICROANAL. 01/2006; 12.
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ABSTRACT: High-resolution transmission electron microscopy and electron energy-loss spectroscopy of a multi-walled carbon nanotube (MWCNT) at elevated temperatures were studied. Although the observation was carried out at 200 kV, the crystal structures of the MWCNT were observed without introducing defects. In addition, contamination on the MWCNT, such as nanobubbles, was removed during the observation at 600 degrees C. In this paper, we report the observation conditions and experimental results. The experimental results obtained both at 600 degrees C and at room temperature were compared.
Journal of Electron Microscopy 02/2001; 50(4):321-4. · 1.31 Impact Factor
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ABSTRACT: Molar dentine was sliced into 100 nm ultrathin sections, by means of a focused ion beam, for observation by energy-filtering transmission electron microscopy (EFTEM). Within the matrix, crystals approximately 10 nm wide and 50-100 nm long were clearly observed. When carbon and calcium were mapped in electron spectroscopic images by EFTEM, carbon failed to localize in crystals. However, it was found in other regions, especially those adjacent to crystals. Because carbon localizations were thought to reflect the presence of organic components, carbon concentration in regions near crystals suggested the interaction of crystals and organics, leading to organic control of apatite formation and growth. Ca was present in almost all regions. The majority of Ca localizing in regions other than crystals may be bound to organic substances present in dentine matrix. These substances are thought to both accumulate Ca and act as reservoirs for crystallization of apatite in dentine.
Journal of Microscopy 02/2001; 201(Pt 1):44-9. · 1.63 Impact Factor
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Scanning 05/1998; 20(3):234-5. · 1.07 Impact Factor
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Philosophical Magazine A 01/1997; 75(1):105-114.
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ABSTRACT: A FIB micro-sampling technique has been developed to facilitate TEM specimen preparation while allowing samples to remain
intact. A deep trench is FIB-milled to remove a portion of the sample containing the region of interest. A micromanipulator
is employed for the purpose of lifting out a small portion of the sample, i.e., the micro-sample. FIB assisted metal deposition
is used to bond the micro-sample to the micromanipulator. The micro-sample is subsequently lifted out and mounted onto an
edge of the micro-sample carrier using FIB assisted metal deposition. The micro-sample is then thinned to the thickness of
about 0.1µm for TEM observation. All of the above steps are accomplished under vacuum in the same FIB system. This procedure
is a reliable TEM specimen preparation technique when the evaluation or failure analysis of a specific site is required. Both
cross sectional and plan view TEM specimen preparations are feasible with this technique. In addition, a technique to prepare
TEM specimens from a specific site has also been developed. In this technique, an FIB system equipped with a FIB/TEM(STEM)
compatible specimen holder is used for thinning of the samples, e.g., a micro-sample. The compatible specimen holder permits
repeated alternating FIB milling and TEM(STEM) observation, enabling TEM specimen preparation from a specific site.
01/1970: pages 229-245;
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