[Show abstract][Hide abstract] ABSTRACT: The problem of testing the configurable analog blocks (CABs) of field programmable analog arrays (FPAAs) is addressed in This work. The considered fault model comprises deviations in the nominal values of CAB programmable capacitors, deviations in the programmable gains of CAB input amplifiers and stuck-on/stuck-open faults in CAB switches. The problem of test stimuli generation is solved, in a first approach, by using the oscillation test strategy (OTS), which is associated to a test response analysis external to the device under test. In a second approach, a built-in self-test (BIST) scheme is proposed by associating to the OTS an output response analyzer (ORA) built using the internal FPAA resources. Both approaches are validated using the ispPAC10 FPAA from the Lattice Semiconductor Corporation. In the paper, the approaches are compared in terms of fault coverage, test application time and required external hardware resources for testing. Experimental results show that a good compromise of these aspects can be found by taking the best of each approach.
Test Conference, 2004. Proceedings. ITC 2004. International; 11/2004
[Show abstract][Hide abstract] ABSTRACT: The use of the oscillation test strategy to test configurable analog blocks of field programmable analog arrays (FPAAs) has been proposed previously, solving the complex problem of test stimuli generation. An improvement to that technique is presented in this paper, using the resources of the FPAA to build an output response analyzer. This new approach offers a full built-in self-test scheme with no area overhead and requiring a low cost automatic test equipment. Experiments show the efficiency of the approach in detecting parametric faults of the tested components.
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE; 05/2004