N. Ahmed
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Publications
(1)
0
Total impact
Article:
Is Test Power Reduction Through X-Filling Good Enough?
Fangmei Wu
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
,
Mohammad Tehranipoor
,
Kohei Miyase
,
Xiaoqing Wen
, N. Ahmed
ITC'10: International Test Conference.
Top co-authors
Mohammad Tehranipoor
(1)
University of Connecticut
Xiaoqing Wen
(1)
Kyushu Institute of Technology
Kohei Miyase
(1)
Fangmei Wu
(1)
Alberto Bosio
(1)
Patrick Girard
(1)
Luigi Dilillo
(1)
Arnaud Virazel
(1)
Serge Pravossoudovitch
(1)
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