T. Barois

Publications (5)7.69 Total impact

• Article: Ohmic electromechanical dissipation in nanomechanical cantilevers

  T. Barois, A. Ayari, A. Siria, S. Perisanu, P. Vincent, P. Poncharal, S. T. Purcell
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  ABSTRACT: We study the contribution of ohmic dissipation to the mechanical damping of nanoresonators. This damping occurs when DC voltage is applied to a resistive resonator, because the mechanical motion modifies the associated capacitance, thus inducing a dissipative current. Silicon carbide nanowire resonators were studied as a function of applied voltage and their geometrical environment. Nanometric positioners were used to control and continuously modify the position of the resonator with respect to counter electrodes. The experimental results are shown to be in agreement with an electromechanical model developed here, which allows for the establishment of a universal formula for the lower dissipation limit of a nanoresonator in its capacitive environment.
  Phys. Rev. B. 02/2012; 85(7).
• Source

  Available from: univ-lyon1.fr

  Article: The mechanical resonances of electrostatically coupled nanocantilevers

  S. Perisanu, T. Barois, P. Poncharal, T. Gaillard, A. Ayari, S. T. Purcell, P. Vincent
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  ABSTRACT: We present here an experimental study of the electrostatic coupling between the mechanical resonances of two nanowires or two nanotubes. This coupling occurs when the eigenfrequencies of the two resonators are matched by electrostatic tuning and it changes from a weak coupling to a strong coupling regime as the distance between the cantilevers is decreased. Linear coupling theory is shown to be in excellent agreement with the experimental data.
  Applied Physics Letters 03/2011; · 3.84 Impact Factor
• Source

  Available from: univ-lyon1.fr

  Article: Performance of field-emitting resonating carbon nanotubes as radio-frequency demodulators

  P Vincent, P Poncharal, T Barois, S Perisanu, V Gouttenoire, H Frachon, A Lazarus, E De Langre, E Minoux, M Charles, A Ziaei, D Guillot, M Choueib, A Ayari, S T Purcell
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  ABSTRACT: We report on a systematic study of the use of resonating nanotubes in a field emission (FE) configuration to demodulate radio frequency signals. We particularly concentrate on how the demodulation depends on the variation of the field amplification factor during resonance. Analytical formulas describing the demodulation are derived as functions of the system parameters. Experiments using AM and FM demodulations in a transmission electron microscope are also presented with a determination of all the pertinent experimental parameters. Finally we discuss the use of CNTs undergoing FE as nanoantennae and the different geometries that could be used for optimization and implementation.
  01/2011;
• Source

  Available from: arxiv.org

  Article: Simple modeling of self-oscillations in nanoelectromechanical systems

  A. Lazarus, T. Barois, S. Perisanu, P. Poncharal, P. Manneville, E. de Langre, S. T. Purcell, P. Vincent, A. Ayari
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  ABSTRACT: We present here a simple analytical model for self-oscillations in nanoelectromechanical systems. We show that a field emission self-oscillator can be described by a lumped electrical circuit and that this approach is generalizable to other electromechanical oscillator devices. The analytical model is supported by dynamical simulations where the electrostatic parameters are obtained by finite element computations.
  Applied Physics Letters 05/2010; 96(19):193114-193114-3. · 3.84 Impact Factor
• Source

  Available from: ArXiv

  Article: Simple modeling of self-oscillation in Nano-electro-mechanical systems

  A. Lazarus, T. Barois, S. Perisanu, P. Poncharal, P. Manneville, E. de Langre, S T Purcell, P Vincent, A. Ayari
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  ABSTRACT: We present here a simple analytical model for self-oscillations in nano-electro-mechanical systems. We show that a field emission self-oscillator can be described by a lumped electrical circuit and that this approach is generalizable to other electromechanical oscillator devices. The analytical model is supported by dynamical simulations where the electrostatic parameters are obtained by finite element computations. Comment: accepted in APL
  04/2010;