Publications (3)32.84 Total impact
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Article: Sparsity-based single-shot subwavelength coherent diffractive imaging.
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ABSTRACT: Coherent Diffractive Imaging (CDI) is an algorithmic imaging technique where intricate features are reconstructed from measurements of the freely diffracting intensity pattern. An important goal of such lensless imaging methods is to study the structure of molecules that cannot be crystallized. Ideally, one would want to perform CDI at the highest achievable spatial resolution and in a single-shot measurement such that it could be applied to imaging of ultrafast events. However, the resolution of current CDI techniques is limited by the diffraction limit, hence they cannot resolve features smaller than one half the wavelength of the illuminating light. Here, we present sparsity-based single-shot subwavelength resolution CDI: algorithmic reconstruction of subwavelength features from far-field intensity patterns, at a resolution several times better than the diffraction limit. This work paves the way for subwavelength CDI at ultrafast rates, and it can considerably improve the CDI resolution with X-ray free-electron lasers and high harmonics.Nature Material 04/2012; 11(5):455-9. · 32.84 Impact Factor -
Article: Sparsity-based single-shot sub-wavelength coherent diffractive imaging
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ABSTRACT: We present the experimental reconstruction of sub-wavelength features from the far-field intensity of sparse optical objects: sparsity-based sub-wavelength imaging combined with phase-retrieval. As examples, we demonstrate the recovery of random and ordered arrangements of 100 nm features with the resolution of 30 nm, with an illuminating wavelength of 532 nm. Our algorithmic technique relies on minimizing the number of degrees of freedom; it works in real-time, requires no scanning, and can be implemented in all existing microscopes - optical and non-optical.12/2011; -
Article: Far-Field Microscopy of Sparse Subwavelength Objects
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ABSTRACT: We present the experimental reconstruction of sub-wavelength features from the far-field of sparse optical objects. We show that it is sufficient to know that the object is sparse, and only that, and recover 100 nm features with the resolution of 30 nm, for an illuminating wavelength of ï¬=532 nm. Our technique works in real-time, requires no scanning, and can be implemented in all existing microscopes - optical and non-optical.10/2010;
Top Journals
- Nature Material (1)
Institutions
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2012
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Technion - Israel Institute of Technology
- Solid State Institute (SSI)
Haifa, Haifa District, Israel
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