F. De Daran

Publications (7)0 Total impact

• Conference Proceeding: Prediction of the field radiated at one meter from PCB's and microprocessors from near EM field cartography

  F. de Daran, J. Chollet-Ricard, F. Lafon, O. Maurice
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  ABSTRACT: The paper shows a near field scanning method to characterize chips that leads to the prediction of the coupling phenomena on the electronic board and to the evaluation of the radiated emission at one meter. A theoretical model is first given for simple circuits. An estimation of the scalar and vector potentials is found with the EM scan. Using these results, we calculate the near and far emissions. Comparisons with experimental results are given. As a conclusion, we propose a simple model describing chip radiated emission and we show a real case use
  Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on; 06/2003
• Article: Immunity Modeling of Integrated Circuits : An Industrial Case

  F. Lafon, F. De Daran, M. Ramdani, P. Perdriau, M. Drissi
  7th International Workshop on Electromagnetic compatibility of Integrated circuits (EMC COMPO 09).
• Article: Immunity modeling of the lm2902 operational amplifier

  S. Op 't Land, F. Lafon, F. De Daran, F.B.J. Leferink, M. Drissi, M. Ramdani
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  ABSTRACT: Component models that predict functional failure are necessary for predicting the immunity of systems to electromagnetic interference (EMI). A method to extract these models using measurements on integrated circuits (ICs) already exists. This measurement method for ICs with single-ended connections is extended, to include ICs with differential connections. The LM2902 op-amp is measured and modeled as a first case study.
• Article: Methods taking into account the vehicle's impact in the development of automotive RF receivers

  R. El Makhour, F. De Daran, F. Lafon, M. Drissi, E. Fourn
  20th EMC.
• Article: Immunity Modeling of Integrated Circuits : an Industrial Case

  F. Lafon, F. De Daran, M. Ramdani, Richard Perdriau, M. Drissi
  IEICE Transactions on Communications.
• Article: Extending the Frequency Range of the Direct Power Injection Test : Uncertainty Considerations and Modeling Approach

  F. Lafon, M. Ramdani, R. Perdriau, M. Drissi, F. De Daran
  7th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC COMPO 09).
• Source

  Available from: ieice.org

  Article: An Industry-Compliant Immunity Modeling Technique for Integrated Circuits

  F. Lafon, M. Ramdani, R. Perdriau, M. Drissi, F. De Daran
  An Industry-Compliant Immunity Modeling Technique for Integrated Circuits.